Hitachi, Ltd.

Yoichi Nakai

Takahiro Sonoda

Hideyuki Kanuka

Gaku Saitou

Efficient generation of test scenarios without excess or lack thereof can be supported. A test scenario generation support device includes a storage device which holds use case scenarios relating to an application of a test target and a computation device which identifies from the use case scenarios a vocabulary on a screen display using a predetermined rule, identifies a screen object corresponding to the identified vocabulary for each of the use case scenarios using a predetermined algorithm, and generates a test scenario based on a test pattern defined in advance for each screen object.

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Tokyo, Japan

Yoichi Nakai