Hamamatsu-photonics K.k.

Teijin Limited

Yoichi Kawada

Hironori Takahashi

Takashi Yasuda

Atsushi Nakanishi

Kouichiro Akiyama

Shinichiro Aoshima

Masatoshi Fujimoto

Jun Takeda

Hiroshi Satozono

Kazuki Horita

Takayoshi Kuga

Kazutaka Tomari

Ikufumi Katayama

Yusuke Arashida

Katsumasa Yoshioka

Takashi Inoue

Koei Yamamoto

Kazuue Fujita

Tatsuo Dougakiuchi

Koyo Watanabe

Toyohiko Yamauchi

Haruyasu Ito

Koji Takahashi

Yoshinori Ikeda

Shigeru Sakamoto

Toru Matsumoto

Hisanari Takahashi

Yoshiyuki Shimizu

Gen Takebe

Shingo Oishi

Kodai Fukazawa

Junshi Soeda

Toshiharu Moriguchi

A spectroscopic measurement device includes: a light source unit configured to output pump light and probe light; a terahertz wave generation unit configured to generate a terahertz wave by the input of the pump light; a terahertz wave detection unit to which the terahertz wave and the probe light are input and configured to modulate the probe light based on a refractive index that changes due to an electro-optical effect according to the input of the terahertz wave; and a light detection unit configured to detect the probe light modulated by the terahertz wave detection unit. A main body unit is configured to include the light source unit and the light detection unit. A measurement unit is configured to include the terahertz wave generation unit and the terahertz wave detection unit. The main body unit and the measurement unit are optically connected to each other by a polarization maintaining fiber.

Spectroscopic measurement device

An optical element includes a laminate including a first refractive index layer and a second refractive index layer having different refractive index for terahertz waves, wherein the laminate includes a pair layer group in which a plurality of pair layers including the first refractive index layer and the second refractive index layer are laminated, wherein the thickness of the first refractive index layer and the thickness of the second refractive index layer are each smaller than a wavelength of the terahertz waves, and wherein each of the pair layers has a predetermined effective refractive index for the terahertz waves depending on a thickness ratio between the first refractive index layer and the second refractive index layer.

Optical element

An optical kit includes a base including a main surface; and a holding unit provided on the main surface to hold an optical system. The holding unit includes a lens holding unit that holds a lens, a reflector holding unit that holds a corner reflector, a first aperture member holding unit that holds a first aperture member, a second aperture member holding unit that holds a second aperture member, and a third aperture member holding unit that holds a third aperture member. The reflector holding unit includes a first mechanism that holds an entirety of the corner reflector so as to be rotatable along the main surface, and a second mechanism configured to adjust an optical axis of a diffracted light in each of a reflective diffraction grating and a mirror.

Optical kit and optical device

An optical element for terahertz waves includes: an optical component including a silicon surface, an antireflection film including an organic resin including a cycloolefin-based polymer as a main component, and inorganic particles dispersed in the organic resin; and an adhesive layer located between the optical component and the antireflection film in a thickness direction of the antireflection film and bonding the silicon surface of the optical component and the antireflection film to each other. The adhesive layer includes a thermally denatured olefin-based polymer.

Optical element for terahertz waves and manufacturing method of the same

A wave plate comprising: a prism member having an entrance surface for receiving a terahertz wave T, and an exit surface for emitting the terahertz wave T received by the entrance surface; wherein the prism member is constituted by a plurality of waveguide regions having: a partial entrance surface for receiving a part of the terahertz wave T, a plurality of total reflection surfaces for totally reflecting the terahertz wave T from the partial entrance surface, and a partial exit surface for emitting the terahertz wave T totally reflected from the total reflection surfaces; and each of the partial entrance surfaces combine to constitute the entrance surface of the prism member, and each of the partial exit surfaces combine to constitute the exit surface of the prism member, by stacking waveguide regions.

Wave plate and divided prism member

A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.

Terahertz wave spectroscopic measurement apparatus and terahertz wave spectroscopic measurement method

An optical measurement device includes a light source configured to output a terahertz wave and coaxial light having a wavelength different from the wavelength of the terahertz wave, coaxially with the terahertz wave; an intensity modulation unit configured to perform intensity modulation of at least the terahertz wave of the terahertz wave and the coaxial light in a predetermined modulation frequency; and a light detection unit configured to synchronously detects each of the terahertz wave and the coaxial light which have acted on a measurement subject via the intensity modulation unit based on the modulation frequency.

Optical measurement device and optical measurement method

In an optical analysis device, a terahertz wave generation module includes a terahertz wave generation unit, and a polarization switching unit that periodically switches a polarization state of a terahertz wave between a first polarization state and a second polarization state that are different from each other on the basis of a frequency signal. An electric field vector measurement unit detects a first electric field vector of a terahertz wave in a first polarization state and a second electric field vector of the terahertz wave in a second polarization state by referring to a frequency signal. An optical parameter analysis unit determines an optical parameter of a measurement target from an intersection between first analysis data based on spectral data obtained by performing Fourier transformation on a product of the first electric field vector and a rotation matrix and second analysis data based on spectral data obtained by performing Fourier transformation on a product of the second electric field vector and the rotation matrix.

Optical analysis device and optical analysis method

A tunnel current control apparatus includes a terahertz wave generation element configured to generate and output a terahertz wave pulse, a CEP adjustment unit configured to adjust a CEP of the terahertz wave pulse, and an off-axis parabolic mirror serving as a focusing element configured to focus the terahertz wave pulse in a gap between a first conductive object and a second conductive object. The CEP adjustment unit can arbitrarily adjust the CEP of the terahertz wave pulse.

Tunnel current control apparatus and tunnel current control method

A tunnel current control apparatus includes a light source, a branching unit, a chopper, an optical path difference adjustment unit, a polarizer, a terahertz wave generation element, a CEP adjustment unit, a terahertz wave detection element, a quarter-wave plate, a polarization separation element, photodetectors, a differential amplifier, a lock-in amplifier, a current measurement unit, a processing unit, mirrors, and off-axis parabolic mirrors. The CEP adjustment unit can arbitrarily adjust a CEP of a terahertz wave pulse. The processing unit obtains a conversion filter used for conversion from an electric field waveform of a far field of the terahertz wave pulse to an electric field waveform of a near field based on a tunnel current measured by the current measurement unit and a correlation detected by the terahertz wave detection element.

Disclosed is a non-linear optical crystal containing pyridinium represented by the following Formula (1), 4-substituted phenylsulfonate represented by the following Formula (2a), and 2,4,6-substituted phenylsulfonate represented by the following Formula (2b). 

Non-linear optical crystal and method for manufacturing same, and terahertz-wave generator and terahertz-wave measuring apparatus

A wavelength conversion element includes a crystal having a periodically poled structure in which polarization is inverted with an inversion period &#x39b; along a z-axis which is an input axis of a light pulse. The wavelength conversion element is configured to generate an output the inversion period &#x39b;(x) at each position x by change of the inversion period &#x39b; according to the position x, and when a target frequency linearly changing with the position x is set to f(x)=b+ax, a frequency width of the output frequency is set to &#x3b4;f(x), and the output frequency is set to f(x)=f(x)+&#x3b1;(x), the output frequency is set to coincide with the target frequency within a range satisfying a condition |&#x3b1;(x)|&#x2264;&#x3b4;f(x).

Wavelength conversion element and wavelength conversion light pulse waveform shaping device

A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

Total reflection spectroscopic measurement device and total reflection spectroscopic measurement method

A spectroscopic measurement apparatus includes a light source, a diffraction grating being a spectroscopic unit, a spatial filter unit, a detection unit, and an analysis unit. The diffraction grating spatially disperses light from the light source, and outputs the light to different optical paths according to a wavelength. The spatial filter unit inputs the light from the diffraction grating to different positions according to the wavelength, applies loss depending on the wavelength to the light, and outputs the light. The detection unit detects the intensity of the light from the spatial filter unit. The analysis unit obtains the intensities of light in an absorption band and light in a non-absorption band of a component in a measurement sample on an optical path between the light source and the detection unit based on the detection result, and evaluates the component in the measurement sample.

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Hamamatsu, Japan

Yoichi Kawada