Formfactor, Inc.

Yoichi Funatoko

Masanori Watanabe

Choon Beng Sia

Peter Andrews

Ken Dawson

Isao Kunioka

Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test (DUT). In some examples, the probe blades are configured to provide a Kelvin electrical connection with the DUT. In some examples, the probe blades include an alignment structure configured to engage with a blade holder when the probe blade is received within a blade-receiving region of the blade holder. The blade holders are configured to separably and operatively attach a probe blade to a probe system. In some examples, the blade holders include the probe blade. The probe systems are configured to electrically test the DUT and include the blade holder.

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Tokyo, Japan

Yoichi Funatoko