Growing community of inventors

Hikone, Japan

Yohei Fujikawa

Average Co-Inventor Count = 1.18

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 2

Yohei FujikawaHideyuki Uehigashi (2 patents)Yohei FujikawaYoshishige Okuno (1 patent)Yohei FujikawaShunsuke Noguchi (1 patent)Yohei FujikawaRimpei Kindaichi (1 patent)Yohei FujikawaYoshiteru Hosaka (1 patent)Yohei FujikawaHidetaka Takaba (1 patent)Yohei FujikawaHidetaka Takaba (1 patent)Yohei FujikawaYohei Fujikawa (22 patents)Hideyuki UehigashiHideyuki Uehigashi (9 patents)Yoshishige OkunoYoshishige Okuno (24 patents)Shunsuke NoguchiShunsuke Noguchi (8 patents)Rimpei KindaichiRimpei Kindaichi (8 patents)Yoshiteru HosakaYoshiteru Hosaka (2 patents)Hidetaka TakabaHidetaka Takaba (2 patents)Hidetaka TakabaHidetaka Takaba (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Showa Denko K.k. (18 from 1,960 patents)

2. Resonac Corporation (4 from 290 patents)

3. Denso Corporation (2 from 19,748 patents)


22 patents:

1. 11946156 - SiC single crystal growth crucible, SiC single crystal manufacturing method, and SiC single crystal manufacturing apparatus

2. 11905621 - SiC single crystal, method of manufacturing SiC ingot, and method of manufacturing SiC wafer

3. 11814749 - Single crystal growth crucible and single crystal growth method

4. 11761114 - Method of producing SiC single crystal ingot

5. 11643749 - Crucible and SiC single crystal growth apparatus

6. 11618969 - SiC single crystal composite and SiC ingot

7. 11459669 - SiC ingot and method of manufacturing SiC ingot

8. 11453959 - Crystal growth apparatus including heater with multiple regions and crystal growth method therefor

9. 11453958 - Heat-insulating shield member and single crystal manufacturing apparatus having the same

10. 11454599 - Thermal conductivity measuring device, heating device, thermal conductivity measuring method, and quality assurance method

11. 11427927 - SiC single crystal manufacturing apparatus and structure having container and filler for manufacturing SiC single crystal

12. 11326274 - Single crystal growth crucible having a first housing and a second housing, and single crystal production device

13. 11306412 - SiC single crystal manufacturing apparatus and SiC single crystal manufacturing method

14. 11261541 - Shielding member and apparatus for single crystal growth

15. 11111599 - Single crystal growth method which includes covering a part of a surface of a raw material for sublimation with a metal carbide powder

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as of
12/30/2025
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