Samsung Electronics Co., Ltd.

Yoav Shereshevski

Avner Dor

Yaron Shany

Jun Jin Kong

Amit Berman

Ariel Doubchak

Tal Philosof

Shay Landis

Moshe Twitto

Evgeny Blaichman

Pil Sang Yoon

Elona Erez

Shmuel Dashevsky

A method of correcting data stored in a memory device includes: applying an iterative decoder to the data; determining a total number of rows in first data the decoder attempted to correct; estimating first visible error rows among the total number that continue to have an error after the attempt; estimating residual error rows among the total number that no longer have an error after the attempt; determining second visible error rows in second data of the decoder that continue to have an error by permuting indices of the residual error rows according to a permutation; and correcting the first data using the first visible error rows.

Encoding and decoding of data using generalized LDPC codes

A memory system includes a memory controller; and a memory device, the memory device including a memory cell array, the memory cell array including least a first memory page having a plurality of memory cells storing a plurality of stored bits, the memory controller being such that, the memory controller performs a first hard read operation on the first memory page to generate a plurality of read bits corresponding to the plurality of stored bits, and if the memory controller determines to change a value of one of a first group of bits, from among the plurality of read bits, the memory controller selects one of the first group of bits based on log likelihood ratio (LLR) values corresponding, respectively, to each of the first group of bits, and changes the value of the selected bit.

Method and apparatus for encoding and decoding data in memory system

A method of programming a non-volatile memory device includes; defining a set of verification voltages, setting a maximum verification voltage among verification voltages that are less than or equal to a first target programming voltage to be a target verification voltage, calculating a number of extra pulses based on the target verification voltage and the first target programming voltage, verifying whether a threshold voltage of the memory cell is equal to or greater than the target verification voltage by applying an incremental step pulse program (ISPP) pulse to the memory cell and then applying at least one verification voltage in the set of verification voltages to the memory cell, and further applying the ISPP pulse to the memory cell a number of times equal to the number of extra pulses when the threshold voltage is verified to be equal to or greater than the target verification voltage.

Non-volatile memory device and programming method using fewer verification voltages than programmable data states

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Ramat Gan, Israel

Yoav Shereshevski