Omnivision Technologies, Inc.

Apple Inc.

Yingkan Lin

Liping Deng

Chun-Yao Huang

Yu-Shen Yang

Tien-Chien Kuo

Ivan Knez

Kanghoon Jeon

Bilin Wang

Patrick B Bennett

Chun-Ming Tang

Hopil Bae

Hasan Akyol

Liang Zuo

John T Wetherell

Cheuk Chi Lo

Xuebei Yang

Bi Yuan

Chun-Hsiang Chang

Zejian Wang

Chung-Lun Edwin Hsu

Fan Zhu

Chaohao Wang

Tiejun Dai

Derek Keith Shaeffer

Sheng Zhang

Baris Cagdaser

Henry C Jen

Shingo Hatanaka

Charles Qingle Wu

Xiaofeng Wang

Mitchell Herman Kline

Min Qu

Zhe Gao

Stanley Bo-Ting Wang

Christopher L Boitnott

Jose Antonio Dominguez-Caballero

Yuxin Wang

Syed Farhan Mohiuddin

Lingtao Wang

Ali Tabatabaei

Alejandro X Levander

Jingwei Lai

To C Tan

Cheng-Pin Lin

Runjie Xu

Peng Xu

Display panels and methods of fabrication are described which a seal ring is formed within a build-up structure over a semiconductor substrate. The seal ring may include an outer perimeter wall and an inner setback wall spaced apart from the outer perimeter wall and directly underneath a contact ledge of the display panel.

Seal ring with inner setback wall for yield improvement

A pixel circuit for an electronic display may include a memory to store a digital data signal indicative of a value within a data range. The pixel circuit may also include a light-emitting diode to emit light based at least in part on the digital data signal. The pixel circuit may also include an initialization transistor to initialize the pixel circuit before the light-emitting diode emits light and a driving transistor to activate based at least in part on the digital data signal.

Pixel circuitry and operation for memory-containing electronic display

Systems and methods may reduce or eliminate image artifacts due to a defective pixel of an electronic display. An electronic display may include pixels that respectively include a self-emissive element, pixel drive circuitry that supplies a pixel drive current to drive the self-emissive element, and signal routing circuitry that reduces or eliminates a visual artifact due to a defective pixel among the pixels. The signal routing circuitry may do this by turning off the self-emissive element, supplying image data from the pixel drive circuitry to a first adjacent pixel, or receiving image data from other pixel drive circuitry from the first adjacent pixel or a second adjacent pixel.

Pixel screening and repair

Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.

Circuitry for screening defective portion of display chip

An electronic display may include an active area having a first pixel formed in the active area, where the first pixel emits light in response to image data. The electronic display may also include a controller to transmit the image data to the first pixel. The first pixel may include an organic light-emitting diode that emits the light in response to the image data, memory to digitally store the image data received from the controller, and driver circuitry to receive the image data from the memory. The driver circuitry may cause the organic light-emitting diode to emit the light in response to the image data.

Memory-in-pixel architecture

An electronic display may include a memory formed in an active area of the electronic display or formed in integrated circuitry of the electronic display that is outside of the active area. The memory may store a digital data signal indicative of a value within a data range. The electronic display may include a driver disposed in the active area, where the driver may generate one or more analog electrical signals in response to the digital data signal. The electronic display may also include a light-modulating device disposed on the active area, where the light-modulating device may emit light based at least in part on the one or more analog electrical signals.

Systems and methods for memory circuitry in an electronic display

A readout circuit includes a comparator coupled to receive a ramp signal an output of a dual conversion gain pixel. A single counter is coupled to the output of the comparator. The counter is coupled to write to only one of a first or a second memory circuits at a time. A first multiplexor is coupled to load either an initial value or an initial memory value from the first memory circuit into the counter. A second multiplexor is coupled to load either a low conversion gain memory value from the first memory circuit or a high conversion gain memory value from the second memory circuit into a single data transmitter, which is coupled to transmit the received memory value to a digital processor.

Dual conversion gain high dynamic range image sensor readout circuit memory storage structure

A readout circuit for use with an image sensor includes a comparator coupled to compare a ramp signal from a ramp generator with an output signal from a pixel of a pixel array. A counter is coupled to the comparator to count until the comparator detects that a ramp signal value has reached an output signal value. The counter includes K cascade-coupled dynamic flip-flop circuits to generate the K least significant bits (LSBs) of the N-bit output of the counter. The counter also includes N-K cascade-coupled static flip-flop circuits to generate the N-K most significant bits (MSBs) of the N-bit output of the counter. A latch is coupled to the counter to store a count value generated by the counter after the ramp signal value has reached the output signal value.

Image sensor readout circuitry including analog-to-digital conversion with hybrid counter structure

An example method for fast ramp start-up during analog to digital conversion (ADC) includes opening a feedback bypass switch coupled to an amplifier to initiate an ADC operation, providing an injection current pulse to an inverting input of the amplifier, where the non-inverting input is coupled to a feedback bypass switch, integrating a first reference current coupled to the inverting input of the amplifier, where the integrating of the first reference current occurs due to the opening of the feedback bypass switch, and providing a reference voltage in response to the injection current pulse, the integrating of the first reference current, and a reference voltage coupled to a non-inverting input of the amplifier, where a level of the reference voltage is increased at least at initiation of the ADC operation in response to the injection current pulse.

Current injection for fast ramp start-up during analog-to-digital operations

Methods and apparatuses for data transmission in an image sensor are disclosed herein. An example data transmission circuit may include a plurality of transmission banks coupled in series with a first one of the plurality of transmission banks coupled to function logic, where each of the plurality of transmission banks are coupled to provide image data to a subsequent transmission bank in a direction toward the function logic in response to a clock signal, a plurality of delays coupled in series, wherein each of the plurality of delays is associated with and coupled to a respective transmission bank of the plurality of transmission banks, and wherein the clock signal is received by each of the plurality of transmission banks after being delayed by a respective number of delays of the plurality of delays in relation to the function logic.

Method and apparatus for data transmission in an image sensor

An image sensor pixel noise measurement circuit includes a pixel array on an integrated circuit chip. The pixel array includes a plurality of pixels including a first pixel to output a first image data signal, and a second pixel to output a second image data signal. A noise amplification circuit on the integrated circuit chip is coupled to receive the first and second image data signals from the pixel array. The noise amplification circuit is coupled to output an amplified differential noise signal in response to the first and second image data signals received from the pixel array. A fast Fourier transform (FFT) analysis circuit on the integrated circuit chip is coupled to transform the amplified differential noise signal output by the noise amplification circuit from a time domain to a frequency domain to analyze a pixel noise characteristic of the pixel array.

Image sensor pixel noise measurement

An example current generator may include a low dropout regulator (LDO) coupled to receive a reference voltage and provide a reference current in response, where the LDO adjusts a current level of the current reference in response to a calibration signal. A current controlled oscillator coupled to receive a reference current copy from the LDO and generate an oscillating signal in response, where a period of the oscillating signal is based at least in part on a level of the reference current copy. A pulse generator coupled to provide an adjustable pulse signal. A counter coupled to determine a number of periods of the oscillating signal occurring during a duration of the pulse signal, and provide a control signal indicative of such, and a digital calibration circuit coupled to receive the control signal and provide the calibration signal to the LDO in response.

Current generator

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San Jose, CA, United States of America

Yingkan Lin