Carnegie Mellon University

Yingjian Chen

Mark H Kryder

A magnetic thin film includes a ferrite-containing underlayer and a ferrite-containing top layer. The composition of the underlayer differs from that of the top layer. During ex-situ annealing of the thin film structure, the underlayer inhibits diffusion of substrate atoms into the top layer. The composition of the underlayer relative to the top layer suppresses grain nucleation within the underlayer relative to the top layer at high temperatures and inhibits the nucleation of grains within the underlayer having undesirable composition, crystal structure, and orientation.

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Pittsburgh, PA, United States of America

Yingjian Chen