Seagate Technology Incorporated

Yingji Ju

Erich Franz Haratsch

Zhengang Chen

David Patmore

An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of input/output requests to a plurality of blocks of the memory that are not marked as bad on a block list, perform a code rate test that programs the plurality of blocks of the memory at three or more code rates of an error correction code scheme, and mark any of the plurality of blocks identified as bad during the code rate test on the block list.

Manufacturer self-test for solid-state drives

An apparatus comprising a memory and a controller. The memory is configured to process a plurality of read/write operations. The memory comprises a plurality of memory modules each having a size less than a total size of the memory. The controller is configured to process a plurality of I/O requests to blocks of the memory that are not marked as bad on a block list. The controller is configured to track a plurality of bad blocks of the memory. The controller is configured to perform a plurality of scans on the memory. The scans are configured to (a) identify the bad blocks, and (b) mark the bad blocks as bad on the block list.

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Shanghai, China

Yingji Ju