Sandisk Technologies Inc.

Sandisk Corporation

Micron Technology Incorporated

Western Digital Technologies, Inc.

Sandisk Tehcnologies Inc.

Yingda Dong

Man Lung Mui

Liang Pang

Ching-Huang Lu

Hong-Yan Chen

Chris Avila

Jiahui Yuan

Jeffrey W Lutze

Gautam Ashok Dusija

Zhengyi Zhang

Masaaki Higashitani

Ken Oowada

Wei Zhao

Deepak Raghu

Gerrit Jan Hemink

Jayavel Pachamuthu

Seungpil Lee

Jian Feng Chen

Johann Alsmeier

Cynthia Hsu

Pao-Ling Koh

Xuehong Yu

Yanli Zhang

Dana Lee

Ashish Kumar Baraskar

Charles S Kwong

Chris Nga Yee Avila

Vinh Diep

Alexander Kwok-Tung Mak

Vinh Q Diep

Wendy Ou

Deepanshu Dutta

Hao Nguyen

Changyuan Chen

Tien-Chien Kuo

Yangyin Chen

Toru Ishigaki

James K Kai

Peter Rabkin

George Matamis

Henry Chin

Shih-Chung Lee

Alex Mak

Yukihiro Sakotsubo

Raghuveer S Makala

Nima Mokhlesi

Jun Xu

Xiying Costa

Hua-Ling Cynthia Hsu

Khanh Vinh Nguyen

Yongke Sun

Hitoshi Miwa

Jingjian Ren

Yan Li

Chang Hua Siau

Yupin K Fong

Steven Theodore Sprouse

Henry Chien

Mohan Dunga

Teruhiko Kamei

Toru Miwa

Kwang-Ho Kim

Albert Fayrushin

Zhenyu Lu

Fumitoshi Ito

Fanglin Zhang

Akira Matsudaira

Manabu Sakai

Yosuke Kato

Kalyan Chakravarthy Kavalipurapu

Haitao Liu

Violante Moschiano

Hiroyuki Ogawa

Nian Niles Yang

Christopher John Petti

Kamal M Karda

Rahul Sharangpani

Fei Zhou

Jun Wan

Koichi Nishimura

Anubhav Khandelwal

Peng Zhang

Mrinal Kochar

Sateesh Koka

Daxin Mao

Shinji Sato

Kensuke Yamaguchi

Lee M Gavens

Somesh Peri

Nan Lu

Hiro Kinoshita

Yichao Huang

Matthias Baenninger

Yifen Liu

Han-Ping Chen

Yen-Lung Li

Wenguang Shi

Jeffrey Ming-Hung Tsai

Xiaolong Hu

Lei Lin

A program operation is initiated to program a set of target memory cells of a target wordline of a memory device to a target programming level. During a program verify operation of the program operation, a program verify voltage level is caused to be applied to the target wordline to verify programming of the set of target memory cells. A pass through read voltage level associated with the target wordline is identified. During the program verify operation, a pass through voltage level is caused to be applied to at least one of a first wordline or a second wordline, wherein the pass through read voltage level is the read voltage level reduced by an offset value.

Corrective program verify operation with improved read window budget retention

Control logic in a memory device initiates a program operation on a memory array, the program operation comprising a seeding phase. During the seeding phase, the control logic causes a seeding voltage to be applied to a string of memory cells in a data block of the memory array during the seeding phase of the program operation and causes a first positive voltage to be applied to a first plurality of word lines of the data block during the seeding phase, wherein each of the first plurality of word lines is coupled to a corresponding memory cell of a first plurality of memory cells in the string of memory cells, the first plurality of word lines comprising a selected word line associated with the program operation. The control logic further causes a second positive voltage to be applied to one or more second word lines coupled to one or more second memory cells on a source-side of the first plurality of memory cells in the string of memory cells during the seeding phase, wherein the second positive voltage is less than the first positive voltage.

Enhanced gradient seeding scheme during a program operation in a memory sub-system

A memory device comprising a memory array and control logic operatively coupled with the memory array. The control logic is to: detect a program operation directed at a selected wordline of multiple wordlines of the memory array; determine, during an initial phase of the program operation, whether a program voltage being applied to the selected wordline satisfies a threshold program voltage; add, in response to the program voltage not satisfying the threshold program voltage, a base offset voltage to an initial pass voltage to generate a higher pass voltage, the initial pass voltage being a percentage of an initial program voltage; and cause the higher pass voltage to be applied to a remainder of the multiple wordlines other than the selected wordline.

Selective increase and decrease to pass voltages for programming a memory device

Control logic can perform operations including obtaining, for each dummy wordline of a set of dummy wordlines, a respective set of step-up voltage parameters, wherein each set of step-up voltage parameters includes a step ratio corresponding to the dummy wordline, and causing a bias voltage with respect to each dummy wordline of the set of dummy wordlines to be ramped to a respective program inhibit bias voltage in accordance with the respective set of step-up voltage parameters. Additionally or alternatively, control logic can perform memory operations including causing a bias voltage with respect to each dummy wordline to be ramped to a power supply voltage during a seed first sub-phase of a pre-programming phase, and maintaining the bias voltage of the first dummy wordline at a first dummy wordline seed voltage throughout a bitline setting sub-phase of the pre-programming phase.

Bias voltage schemes during pre-programming and programming phases

Some embodiments include apparatuses and methods of forming the apparatuses. One of the apparatuses includes a memory cell included in a memory cell string; the memory cell including charge storage structure and channel structure separated from the charge storage structure by a dielectric structure; a first control gate associated with the memory cell and located on a first side of the charge storage structure and a first side of the channel structure; and a second control gate associated with the memory cell and electrically separated from the first control gate, the second control gate located on a second side of the charge storage structure and a second side of the channel structure.

Memory device having memory cell strings and separate read and write control gates

Processing logic in a memory device initiates a program operation on a memory array, the program operation comprising a program phase and a program verify phase. The processing logic further causes a negative voltage signal to be applied to a first selected word line of a block of the memory array during the program verify phase of the program operation, wherein the first selected word line is coupled to a corresponding first memory cell of a first plurality of memory cells in a string of memory cells in the block, wherein the first selected word line is associated with the program operation.

Detrapping electrons to prevent quick charge loss during program verify operations in a memory device

An electronic device comprises a stack of alternating dielectric materials and conductive materials, a pillar region extending vertically through the stack, an oxide material within the pillar region and laterally adjacent to the dielectric materials and the conductive materials of the stack, and a storage node laterally adjacent to the oxide material and within the pillar region. A charge confinement region of the storage node is in horizontal alignment with the conductive materials of the stack. A height of the charge confinement region in a vertical direction is less than a height of a respective, laterally adjacent conductive material of the stack in the vertical direction. Related methods and systems are also disclosed.

Electronic devices comprising reduced charge confinement regions in storage nodes of pillars and related methods

A memory device includes a memory array of memory cells and control logic, operatively coupled with the memory array. The control logic is to perform operations, which include causing the memory cells to be programmed with an initial voltage distribution representing multiple logical states; causing the memory cells to be programmed with a subsequent voltage distribution representing a subset of the multiple logical states at a higher voltage than that of the initial voltage distribution, wherein the subset of the multiple logical states is compacted above a program verify voltage level for the subsequent voltage distribution; and causing a first program verify operation of the subsequent voltage distribution to be performed on the memory cells to verify one or more voltage levels of the subsequent voltage distribution.

Distributed compaction of logical states to reduce program time

Control logic in a memory device initiates a program operation on the memory device, and causes a program voltage to be applied to a selected wordline of the memory array during a program phase of the program operation. The control logic further causes a select gate drain coupled with a string of memory cells in the memory array to deactivate during a recovery phase after applying the program voltage, wherein the string of memory cells comprises a plurality of memory cells, and wherein each memory cell of the plurality of memory cells is coupled to a corresponding wordline of a plurality of wordlines in the memory array.

Short program verify recovery with reduced programming disturbance in a memory sub-system

A device might include a common source, a three-dimensional array of memory cells, a plurality of access lines, and a controller. The three-dimensional array of memory cells might include a plurality of NAND strings. Each NAND string might be selectively connected between a corresponding data line and the common source. Each access line of the plurality of access lines might be connected to a control gate of a respective memory cell of each NAND string of the plurality of NAND strings. The controller might be configured to access the three-dimensional array of memory cells to implement a source-side seeding operation.

Apparatus and methods for seeding operations concurrently with data line set operations

A memory device includes a memory array of memory cells. A page buffer is to apply, to a bit line, a first voltage or a second voltage that is higher than the first voltage during a program verify operation. Control logic operatively coupled with the page buffer is to perform operations including: causing a plurality of memory cells to be programmed with a first program pulse; measuring a threshold voltage for the memory cells; forming a threshold voltage distribution from the measured threshold voltages; classifying, based on the threshold voltage distribution, a first subset of the memory cells as having a faster quick charge loss than that of a second subset of the memory cells; and causing, in response to the classifying, the page buffer to apply the second voltage to the bit line during a program verify operation performed on any of the first subset of memory cells.

Dual verify for quick charge loss reduction in memory cells

Control logic in a memory device initiates a program operation on the memory device, the program operation comprising a program phase, a program recovery phase, a program verify phase, and a program verify recovery phase. The control logic further causes a negative voltage signal to be applied to a first plurality of word lines of a data bock of the memory device during the program verify recovery phase of the program operation, wherein each of the first plurality of word lines is coupled to a corresponding memory cell of a first plurality of memory cells in a string of memory cells in the data block, the first plurality of word lines comprising a selected word line associated with the program operation and one or more data word lines adjacent to the selected word line.

Control logic in a memory device initiates, subsequent to a program verify phase of a program operation, a new program operation on the memory array, the new program operation comprising a pre-boosting phase occurring prior to a program phase. The control logic causing one or more positive pre-boosting voltages to be applied to corresponding subsets of a plurality of word lines of a block of the memory array during the pre-boosting phase and causes the one or more positive pre-boosting voltages to be ramped down to a ground voltage during the pre-boosting phase in a designated order based on a location of the corresponding subsets of the plurality of word lines to which the one or more positive pre-boosting voltages were applied.

Pre-boosting scheme during a program operation in a memory sub-system

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San Jose, CA, United States of America

Yingda Dong