Mediatek Corporation

Ying-Chou Shih

Chang-Lin Wei

Sheng-Wei Lei

Yi-Chieh Lin

Yen-Ju Lu

Jing-Hui Zhuang

Che-Hsien Huang

Chih-Yang Liu

Chih-Ming Hung

Yen-Liang Chen

Chun-Hsien Peng

Po-Sen Tseng

Jui-Lin Hsu

Yeh-Chun Kao

Wun-Jian Lin

Shih-Chia Chiu

Chun-Wei Yang

Yu-An Chen

This disclosure provides a test kit for testing a device under test (DUT) including a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having a nest and an interposer substrate installed under the nest.

Test kit for testing a device under test

A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having at least an interposer substrate sandwiched by a top socket and a nest.

A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT. The DUT includes an antenna and radiates a RF signal. The test kit further includes a reflector having a lower surface. The RF signal emitted from the antenna of the DUT is reflected by the reflector and a reflected RF signal is received by the antenna of the DUT.

A wireless test system includes a load board having an upper surface and a lower surface. The load board has a testing antenna disposed on the load board. A socket for receiving a device under test (DUT) having an antenna structure therein is disposed on the upper surface of the load board. The antenna structure is aligned with the testing antenna. The wireless test system further includes a handler for picking up and delivering the DUT to the socket. The handler has a clamp for holding and pressing the DUT. The clamp is grounded during testing and functions as a ground reflector that reflects and reverses radiation pattern of the DUT from an upward direction to a downward direction toward the testing antenna.

Wireless test system for testing microelectronic devices integrated with antenna

An integrated circuit (IC) is provided. The IC includes an RF transmitter configured to generate an RF signal in response to a command signal from test equipment; an RF receiver configured to generate an evaluation signal according to the RF signal, and report the evaluation signal to the test equipment, so that the test equipment performs a test analysis on the evaluation signal to determine a test result, wherein the test equipment is external to the IC.

RF testing system

Growing community of inventors

Hsinchu, Taiwan

Ying-Chou Shih