Macronix International Co., Ltd.

Ying-Chieh Tsai

Wing-Chor Chan

Jeng Gong

Shyi-Yuan Wu

Hsin-Liang Chen

Chia-Hui Cheng

Provided is a semiconductor device including a substrate having a first conductivity type, a first well having a second conductivity type, a first doped region having the first conductivity type, a second well having the second conductivity type, at least one second doped region having the first conductivity type, at least one third doped region having the second conductivity type, and a fourth doped region having the second conductivity type. The first well is located in the substrate. The first doped region is located in the first well. The second well is located in the first well. The second doped region is located in the first doped region. The third doped region is located in the first well at a first side of the first doped region. The fourth doped region is located in the first well at a second side of the first doped region.

Semiconductor device and method of manufacturing the same

An electrostatic discharge device includes a power clamping circuit and an isolation circuit. The power clamping circuit includes a first Zener diode and a second Zener diode. A cathode of the first Zener diode is coupled to a first power supply line. An anode of the first Zener diode is coupled to an anode of the second Zener diode. A cathode of the second Zener diode is coupled to a second power supply line. The isolation circuit includes a first isolation diode and a second isolation diode. A cathode of the first isolation diode is coupled to the first power supply line. An anode of the first isolation diode is coupled to a cathode of the second isolation diode and a circuit being protected. An anode of the second isolation diode is coupled to the second power supply line.

Electrostatic discharge device

A high voltage (HV) device and method for manufacturing the same are provided, at least comprising a substrate, an insulation formed on the substrate, a deep well formed in the insulation, an air layer formed in the insulation and disposed adjacent to the bottom surface of the deep well. A bottom surface of the deep well is spaced apart from the substrate. Also, the air layer, interposed between the deep well and the substrate, is spaced apart from the substrate. In one embodiment, an air layer further communicates with an atmosphere outside the HV device, which facilitates heat dissipation.

High voltage device and method for manufacturing the same

A semiconductor device formed in a substrate, including a first region, a second region formed over the first region, a third region, a fourth region formed over the third region, and a fifth region formed over the first region and contacting the second region. The first, second, and fourth regions have a first-type conductivity, and constitute drain region, drain electrode, and source region of a metal-on-semiconductor (MOS) structure. The second region has a higher doping level than the first region. The third region has a second-type conductivity and constitutes channel and body regions of the MOS structure. The fifth region has the second-type conductivity and constitutes an emitter region of a bipolar junction (BJ) structure. The second and third regions constitute base and collector regions of the BJ structure.

High-voltage electrostatic discharge device incorporating a metal-on-semiconductor and bipolar junction structure

A semiconductor device includes first metal-on-semiconductor (MOS), second MOS, and bipolar junction (BJ) structures formed in a substrate. The first MOS structure includes first drain, first channel, and first source regions arranged along a first direction. The first MOS structure further includes a drain electrode formed over and conductively coupled to the first drain region, and a body region formed below and conductively coupled to the channel region. The second MOS structure includes second drain, second channel, and second source regions arranged along a second direction different from the first direction. The BJ structure includes emitter, base, and collector regions. The first source region and the second drain region share a first common semiconductor region in the substrate. The drain electrode and the base region share a second common semiconductor region in the substrate. The body region and the collector region share a third common semiconductor region in the substrate.

Semiconductor device

A semiconductor device includes a substrate, a first doped well disposed in the substrate, a second doped well disposed in the substrate adjacent to a first side of the first doped well, a buffer region disposed in the first doped well adjacent to a second and opposite side of the first doped well, a gate structure disposed above the first side of the first doped well and extending along a first horizontal direction, a first contact region disposed in the buffer region toward the second side of the first doped well, a second contact region disposed in the buffer region adjacent to the first contact region, and a doped region disposed in the buffer region under the first contact region.

A semiconductor structure is provided. The semiconductor structure comprises: a substrate; a first doping region, a first well and a second doping region formed in the substrate; a plurality of first heavily doped regions formed in the first doping region; a plurality of conductors and a plurality of dielectrics formed on the substrate between the first heavily doped regions; a second heavily doped region formed in the first well; a third heavily doped region and a fourth heavily doped region formed in the second doping region; as well as a first gate electrode and a first gate dielectric. The first doping region, the first well, the second heavily doped region and the fourth heavily doped region have a first type of doping. The second doping region, the first heavily doped regions and the third heavily doped region have a second type of doping.

Semiconductor structure having field plates over resurf regions in semiconductor substrate

A semiconductor device includes a substrate having a first conductivity type, a first heavily-doped region formed in the substrate and having the first conductivity type, a second heavily-doped region formed in the substrate and having the first conductivity type, and an embedded layer formed in the substrate and separated from the first and second heavily-doped regions. The embedded layer has a second conductivity type different from the first conductivity type. A portion of the embedded layer is beneath the first heavily-doped region. A third heavily-doped region is formed in the substrate, between the first and second heavily-doped regions, and contacting the embedded layer, and has the second conductivity type.

Provided is a semiconductor device including a deep doped region of a first conductivity type, a well region of a second conductivity type, a base region of the first conductivity type, an insulated gate bipolar transistor (IGBT) and a metal oxide semiconductor (MOS). The well region is disposed in the deep doped region. The base region is disposed in the well region and is not connected to the deep doped region. The IGBT is disposed on the well region at the first side of the base region, and includes a first doped region of the second conductivity type disposed in the base region. The MOS is disposed on the well region and the deep well region at the second side of the base region, and includes a second doped region of the second conductivity type disposed in the base region.

Semiconductor device and method of fabricating the same

A semiconductor device and an operating method for the same are provided. The semiconductor structure comprises a first doped region, a second doped region, a third doped region, a fourth doped region and a first gate structure. The first doped region has a first type conductivity. The second doped region has a second type conductivity opposite to the first type conductivity. The first doped region is surrounded by the second doped region. The third doped region has the first type conductivity. The fourth doped region has the second type conductivity. The first gate structure is on the second doped region. The third doped region and the fourth doped region are in the second doped region and the first doped region on opposing sides of the first gate structure respectively.

Semiconductor device and operating method for the same

A semiconductor device and an operating method for the same are provided. The semiconductor device includes a first doped region, a second doped region, a first doped contact, a second doped contact, a first doped layer, a third doped contact and a first gate structure. The first doped contact and the second doped contact are on the first doped region. The first doped contact and the second doped contact has a first PN junction therebetween. The first doped layer is under the first or second doped contact. The first doped layer and the first or second doped contact has a second PN junction therebetween. The second PN junction is adjoined with the first PN junction.

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Chiayi, Taiwan

Ying-Chieh Tsai