The Chinese University of Hong Kong

Lawrence Livermore National Security, LLC

Yina Chang

Shih-Chi Chen

Sourabh Kumar Saha

Dapeng Zhang

Chenglin Gu

Erxuan Zhao

Dihan Chen

Hiu Hung Lee

Chenyang Wen

A laser-based manufacturing system is disclosed for fabricating non-planar three-dimensional layers. The system may have a laser for producing a laser beam with a plurality of optical wavelengths. An optically dispersive element may be used for receiving the laser beam and splitting the beam into a plurality of distinct beam components, wherein each beam component has spatially separated optical spectral components. A phase mask may be used which is configured to receive at least one of the beam components emerging from the dispersive element and to create a modified beam. One or more focusing elements may then be used to receive the modified beam emerging from the phase mask and to focus the modified beam into a non-planar light sheet for use in fabricating a part.

System and method for curved light sheet projection during two-photon polymerization

Systems and methods for dicing a sample by a Bessel beam matrix are disclosed. The method for dicing a sample by a Bessel beam matrix may comprise generating a Bessel beam matrix including multiple Bessel beams arranged in a matrix form, according to a predetermined dicing layout of the sample; controlling a focus position of each Bessel beam in the generated Bessel beam matrix; and focusing simultaneously the Bessel beams of the Bessel beam matrix at the respective controlled focus positions within the sample for dicing.

Systems and methods for dicing samples using a bessel beam matrix

Methods and systems for axial-scanning a sample. The method may include generating a scanning beam along a transverse scanning direction across the sample; acquiring radial positions of the generated scanning beam along the transverse scanning direction; and determining, based on the radial positions of the generated scanning beam and desired focal lengths, a phase mask so that the scanning beam at different radial positions along the scanning direction is focused to different axial positions of the sample along an optical axis transverse to the scanning direction.

System and method for axial scanning based on static phase masks

Growing community of inventors

Hong Kong, China

Yina Chang