Nxp Usa, Inc.

Freescale Semiconductor,inc.

Yin Guo

Shayan Zhang

Zhihong Cheng

Wanggen Zhang

Yizhong Zhang

Lei Zhang

Wenzhong Zhang

Xiaolei Wu

Xiuqiang Xu

Xu Zhang

Kun Wu

Xuewen He

Haitian Zhou

Haifeng Bai

A calibration circuit for body biasing includes a phase detector, first and second voltage generators, and first and second voltage regulators. The phase detector has an input terminal configured to receive an oscillation signal from a ring oscillator. The phase detector provides output signals indicative of phase differences between the oscillation signal and a reference signal. The first voltage generator provides a first reference voltage using the output signals from the phase detector, and the first voltage regulator provides a first biasing voltage using the first reference voltage. The second voltage generator provides a second reference voltage using the first reference voltage, and the second voltage regulator provides a second biasing voltage using the second reference voltage. The first biasing voltage is used to bias P-wells of transistors in the ring oscillator, and the second biasing voltage is used to bias N-wells of transistors in the ring oscillator.

FD-SOI device calibration circuit and method therefor

Electromagnetic compatibility (EMC) of a system-on-a-chip (SoC) is enhanced by encoding at least a subset of control signals before the control signals are transmitted over a bus (e.g., a bus internal to a SoC) from a controller to an embedded nonvolatile memory (NVM). The error-detection code used causes an EMC event to introduce errors into the transmitted codewords with relatively high probability. In response to an error being detected in the transmitted codeword, a set of safeguarding operations are performed to prevent the data stored in the NVM from being uncontrollably changed.

Protecting embedded nonvolatile memory from interference

An integrated circuit that includes a processor also has an on-chip current test circuit that indirectly measures quiescent current in the processor. A supply voltage pin of the integrated circuit receives a supply voltage from an external test unit to provide power to the processor. The on-chip test circuit measures a voltage change across the processor during a predetermined test period T when the processor is isolated from the supply voltage and the clock signal is stopped. The voltage change provides an indication of quiescent current corresponding to the processor.

On-chip current test circuit

A system for prototyping an integrated circuit (IC) that has a mixed signal intellectual property (IP) core includes implementing the IP core using discrete programmable digital ICs and discrete analog ICs by partitioning the IP core into a digital IP portion and an analog IP portion.

Mixed signal IP core prototyping system

A voltage level shifter has an input circuit with an inverter coupled to an input node, a pull-down control transistor with a gate coupled to a first node of the inverter, and a pull-up control transistor with a gate coupled to a second node of the inverter. Sources of the pull-down and pull-up control transistors are coupled to a low voltage reference. A transient connectivity limiter (TCL) has pull-down and pull-up transistors. Two control inputs are coupled to respective first and second nodes of the inverter and path inputs are coupled to respective drains of the pull-down and pull-up control transistors. An output circuit has inputs coupled to pull-up and pull-down nodes of the TCL. During a voltage level transition at the input node, the TCL connects the pull-up node to the low voltage reference through the TCL pull-up transistor transitioning from a saturation to a sub-threshold region of operation.

Voltage level shifter

Growing community of inventors

Tianjin, China

Yin Guo