Himax Display, Inc.

Himax Technologies, Inc.

Yih-Long Tseng

Hon-Yuan Leo

Ming-Cheng Chiu

Cheng-Chi Yen

Biing-Seng Wu

Yen-Chen Chen

Kuan-Hsu Fan-Chiang

Shwang-Shi Bai

Yung-Yuan Ho

Yuet Wing Li

Ju-Tien Cheng

Ying-Jhong Tseng

A driving method for a display apparatus is provided. The display apparatus includes data lines, scan lines and pixel units. Each pixel unit includes a pixel electrode and a common electrode. The driving method includes the following steps: when the display apparatus enters from a first frame period into a second frame period, switching a voltage level of a common voltage from a first common voltage level to a second common voltage level, and simultaneously changing a voltage level of the pixel electrode; during a data period of the second frame period, driving the scan lines according to a scanning sequence so as to write display data transmitted by data lines into the pixel units; and during a reset period of the second frame period, driving the scan lines according to the scanning sequence so as to write reset data transmitted by the data lines into the pixel units.

Display apparatus and related driving method utilizing common voltage modulation

A display panel driving apparatus and method are provided. The display panel driving apparatus includes a timing control circuit, a memory, a compensation circuit and a data driving circuit. The memory provides at least one coupling-capacitance information between a current pixel and at least one adjacent pixel in a display panel. By using the coupling-capacitance information, the compensation circuit compensates the current pixel data to obtain the compensated pixel data for compensating the voltage offset of the current pixel caused by the coupling voltage of the adjacent pixel. The data driving circuit drives the current pixel according to the compensated pixel data.

Display panel driving apparatus and method for compensating pixel voltage

A pixel circuitry of a display device and a display method thereof are provided herein. The pixel circuitry includes a scan switch, a storage element, and a sampling circuitry. The scan switch has a first terminal coupled to a data line and configured to be asserted according to a scan signal. The storage element is coupled to a second terminal of the scan switch and configured to store a pixel voltage from the data line. The sampling circuitry is configured to sample the stored pixel voltage of the storage element and to obtain a reference voltage for the display device according to the sampled signal. By sampling the stored pixel voltage of the storage element, whether the pixel voltages with different polarities are symmetry can be detected for avoiding flickers.

Pixel circuitry of display device and display method thereof

A current-type driver of light emitting devices is provided. The current-type driver includes a power conversion circuit, a feedback module, and a control module. The power conversion circuit modulates and generates an output voltage according to a feedback signal so as to sequentially drive a plurality of light emitting devices. The feedback module generates the feedback signal for the power conversion circuit according to the output voltage and an adjusting signal during a first period, wherein none of the light emitting devices is driven during the first period. The control module outputs the adjusting signal to the feedback module during the first period so as to allow the power conversion circuit to adjust the output voltage to a pre-drive voltage corresponding to the light emitting device which is to be driven next among the light emitting devices.

Current-type driver of light emitting devices

A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.

Growing community of inventors

Tainan County, Taiwan

Yih-Long Tseng