Texas Instruments Corporation

Yicheng Zhou

Xiaodong Li

Kangcheng Xu

Various examples disclosed herein relate to current sensing via current sensing circuitry, and more particularly, to calibrating current sensing circuitry to dynamically detect current ranges across a load. In an example embodiment, a microcontroller unit (MCU) is provided herein that includes a processor and current sensing circuitry coupled to the processor. The current sensing circuitry of the MCU is configured to measure voltages associated with a load. The processor of the MCU is configured to obtain the measured voltages from the current sensing circuitry, identify a temperature drift of the current sensing circuitry that exceeds a threshold value, update parameters with which to determine a current associated with the load based on the temperature drift, and determine the current associated with the load based on the updated parameters and the measured voltages.

Growing community of inventors

Shanghai, China

Yicheng Zhou