Sandisk Technologies Inc.

Western Digital Technologies, Inc.

Yibo Yin

Tianhong Yan

Tz-Yi Liu

Gopinath Balakrishnan

Yuheng Zhang

Yan Li

Daniel Lee Helmick

Toru Miwa

Kent Douglas Anderson

Po-Shen Lai

Mai Ghaly

Hiroyuki Mizukoshi

Vijay Chinchole

Henry Zhang

Hao Su

Jayesh Pakhale

Spyridon Georgakis

Gordon Yee

Apparatuses, systems, and methods are disclosed for data availability during temporary inaccessibility of a memory region for memory. An apparatus may include a plurality of memory elements and a controller. A controller may be configured to identify a portion of memory of a plurality of memory elements such that data stored in a portion of memory is temporarily inaccessible and other data stored in other portions of memory in the plurality of memory elements is accessible. A controller may be configured to reconstruct data stored in a portion of memory from other data stored in other portions of memory. A controller may be configured to provide reconstructed data while a portion of an array is temporarily inaccessible.

Data availability during memory inaccessibility

Apparatuses, systems, methods, and computer program products are disclosed for a multicore on-die memory controller. An integrated circuit device includes an array of non-volatile memory cells and a microcontroller unit. A microcontroller unit includes a plurality of processing units. Different processing units perform different categories of tasks in parallel for an array of non-volatile memory cells.

Multicore on-die memory microcontroller

A sequencer circuit is configured to generate control signals for on-die memory control circuitry. The control signals may include memory operation pulses for implementing operations on selected non-volatile memory cells embodied within the same die as the sequencer (and other on-die memory control circuitry). The timing, configuration, and/or duration of the memory control signals are defined in configuration data, which can be modified after the design and/or fabrication of the die and/or on-die memory circuitry. As such, the timing, configuration, and/or duration of the memory control signals generated by the sequencer may be manipulated after the design and/or fabrication of the die, sequencer, and other on-die memory control circuitry.

Systems and methods for on-die control of memory command, timing, and/or control signals

Independent sense amplifier addressing provides separate column addresses to individual sense amplifier groups within a single bay during one column address cycle. A memory system determines whether the individual memory cells or bits of a column at a bay can be skipped. For each sense amplifier group having at least one memory cell (or bit) that needs to be programmed, the system determines for the first column address whether the memory cell can be skipped. If a bit or memory cell having a first column address from the sense amplifier group can be skipped, the system determines a next bit having a column address from the group that needs to be programmed. The system groups the next column address for programming during the first column address cycle. The system can program a different column address for different sense amplifier groups within the bay during a single column address cycle.

Independent sense amplifier addressing and quota sharing in non-volatile memory

Growing community of inventors

Sunnyvale, CA, United States of America

Yibo Yin