Altera Corporation

Intel Corporation

Yi Peng

Mahesh A Iyer

Scott J Weber

Sean R Atsatt

Andrew Martyn Draper

Kevin Nealis

Paul Kim

Jun Pin Tan

Gary Brian Wallichs

Bee Yee Ng

Kalen Brunham

Brandon Lewis Gordon

Alfredo De La Cruz

Krishna Nagar

Nathan Edward Krueger

Kenton Orthner

Brandon Gordon

An integrated circuit includes a monitored circuit and a signal analyzer circuit. The signal analyzer circuit includes a logic circuit that determines if a condition signal satisfies a condition to generate an output signal. A first-in-first-out (FIFO) buffer circuit stores opportunistic data indicated by a monitored signal received from the monitored circuit in response to the output signal indicating if the condition signal satisfies the condition. A communication channel transmits the opportunistic data stored in the FIFO buffer circuit outside the integrated circuit.

Circuits and methods for accessing signals in integrated circuits

Systems and methods for non-destructive readback and writeback of an integrated circuit system are provided. Such a system may include an adaptive logic element including a first register pair. The first register pair may include a first register operating at a first frequency and a second register operating at a second frequency. The second frequency may be equal to or lower than the first frequency. The second register may store data from the first register. The adaptive logic element may also include a first clock providing a first clock signal to the first register and a second clock providing a second clock signal. The adaptive logic element may also include a multiplexer that may select the first clock signal or the second clock signal as a clock source for the second register.

Non-destructive readback and writeback for integrated circuit device

A system includes an integrated circuit device configured to implement a circuit design. The integrated circuit device includes a communication interface configured to receive the circuit design in a configuration bitstream and instrumentation logic in the configuration bitstream and signal collector block configured to collect signal data based on the instrumentation logic during implementation of the circuit design.

Circuit design visibility in integrated circuit devices

Integrated circuits may have programmable logic circuitry and hard-coded circuitry. The hard-coded circuitry may include data circuitry, a processor, and memory. As the hard-coded circuitry has a limited capacity, a portion of the programmable logic circuitry may be configured using configuration data to serve as expanded soft-coded memory for the hard-coded processor. Instructions for controlling settings of the data circuitry may be stored on the hard-coded and soft-coded memory. An additional portion of the programmable logic circuitry may be configured using the configuration data to serve as a soft-coded processor that executes the instructions stored on the soft-coded memory. Use of the soft-coded processor and/or expanded soft-coded memory may allow for more advanced algorithms for initialization and calibration of the data circuitry than when only hard-coded memory is used and may allow for updated processor circuitry to be implemented.

Integrated circuits having expandable processor memory

An integrated circuit device includes a first partition and a second partition. The integrated circuit device also includes a Joint Test Action Group (JTAG) system that controls at least a portion of the integrated circuit device via logic signals. The JTAG system includes a JTAG interface that receives logic signals and a first JTAG hub instantiated in the first partition communicatively coupled to the JTAG interface. The integrated circuit device further includes a second JTAG hub instantiated in the second partition communicatively coupled to the first JTAG hub via a bridge.

Sharing a JTAG interface among multiple partitions

Devices and methods for initializing one or more registers of a programmable integrated circuit (IC) to store an initial condition value are provided. A first bitstream that programs the region of the IC to supply the initial condition value to the one or more registers is first programmed on the IC. Then, once the registers are initialized with the initial condition value, a second bitstream is subsequently programmed to the region of the IC to supply values associated with a function of the design to the one or more registers.

Initial condition support for partial reconfiguration

An integrated circuit device includes a first partition and a second partition. The integrated circuit device also includes a Joint Test Action Group (JTAG) system that controls at least a portion of the integrated circuit device via multiple logic signals. The JTAG system includes a JTAG interface receives the multiple logic signals. The JTAG system also includes a JTAG hub instantiated in the first partition and being communicatively coupled to the JTAG interface. The JTAG system further includes JTAG-based logic instantiated in the second partition. The integrated circuit device further includes an interface instantiated in the first partition configured to communicatively couple the JTAG hub to the JTAG-based logic.

Systems and methods are provided for coordinating the partial reconfiguration of a region of a configurable device (e.g., a SDM/CNoC/LSM system or device) through an interface that coordinates the stopping of the current persona in that region, the resetting of the new current persona, and the starting of the new persona in a manner that does not corrupt the memory of the affected region. The interface further provides signaling that the static region can use to protect itself during the partial reconfiguration, and disallows multiple partial reconfigurations of the same region at the same time.

Partial reconfiguration control interface for integrated circuits

Techniques and mechanisms debug a device implementing an optimized design using a pre-optimized design simulation. For example, data indicating interconnect in a pre-optimized design to simulate may be received. A node in common between the pre-optimized design and an optimized design may be identified. A tap at the output of the node in the optimized design may be inserted for providing data for the simulation.

Debugging an optimized design implemented in a device with a pre-optimized design simulation

Integrated circuits may include embedded logic analyzer circuitry that monitors and stores data received from logic circuitry. The logic analyzer circuitry may include storage circuitry and logic analyzer control circuitry that controls the storage circuitry. The control circuitry may include trigger condition circuitry that compares the data to a trigger condition. When the data satisfies the trigger condition, the storage circuitry may stop storing the data and stored data may be conveyed to fault detection circuitry for debugging the design of the logic circuitry. The integrated circuit may include programmable memory elements that can be loaded with configuration data. The logic analyzer circuitry may include partial-reconfiguration control circuitry that reconfigures the control circuitry without reconfiguring other portions of the integrated circuit. The partial-reconfiguration control circuitry may, for example, update the trigger condition by reconfiguring the control circuitry while the rest of the integrated circuit continues to operate normally.

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Newark, CA, United States of America

Yi Peng