Chroma Ate Inc.

Yi-Lung Weng

I-Shih Tseng

Lan-Sheng Yang

Ming-Chieh Lin

Ching-Lin Lee

Chien-Hsun Chu

An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

Inspection system and method for obtaining an adjusted light intensity image

A solar cell testing system includes a multifunctional testing light source, a measuring unit, and an arithmetic unit. The multifunctional testing light source is configured to be switched to output a simulated solar light to a solar cell or asynchronously output a plurality of narrowband lights to the solar cell. The measuring unit is coupled to the solar cell and measures the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights. The arithmetic unit is coupled to the multifunctional testing light source and the measuring unit; it determines the solar cell's conversion efficiency and spectral response based on the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights.

Growing community of inventors

Tao-Yuan, Taiwan

Yi-Lung Weng