Adv Antest Corporation

Omnivision Technologies, Inc.

Yi Liu

Hiroaki Ebihara

Alan S Krech, Jr

Zhenfu Tian

Tao Sun

Shan Chen

Xinguo Zhang

Darrin Paul Albers

Ze'ev Raz

Jesse Hobbs

Shigeo Chiyoda

A ramp generator includes an operational amplifier having an output to generate a ramp signal. An integration current source is coupled to a first input and a reference voltage is coupled to a second input of the operational amplifier. A feedback capacitor is coupled between the first input and the output of the operational amplifier. A monitor circuit is coupled to the first and second inputs of the operational amplifier to generate an output flag in response to a comparison of the first and second inputs. A trimming control circuit is configured to generate a trimming signal in response to the output flag. An assist current source is configured to conduct an assist current from the output of the operational amplifier to ground in response the trimming signal generated by the trimming control circuit.

Trimming control circuit for current integration ramp DAC settling assist circuit

Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.

Method and system for advanced fail data transfer mechanisms

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San Jose, CA, United States of America

Yi Liu