Semiconductor Manufacturing International (shanghai) Corporation

Semiconductor Manufacturing International (beijing) Corporation

Yi Jin Kwon

Hao Ni

Hong Yu

Chuntian Yu

Yu Cheng

Xiao Liu

Jim Chia-Ming Hsu

Chang Wei Yin

A non-volatile memory (NVM) includes at least one memory unit region, each including a memory array and having first memory cells in the odd columns and second memory cells in the even columns. Corresponding to each memory unit region, the NVM includes a multiplexer including first bit line decoders and second bit line decoders, a comparator circuit including a first input terminal and a second input terminal, and a bias generation circuit generating a bias voltage. When reading a data information from a first memory cell, a first output voltage of the first memory cell is sent to the first input terminal and the bias voltage is sent to the second input terminal. When reading a data information from a second memory cell, a second output voltage of the second memory cell is sent to the second input terminal and the bias voltage is sent to the first input terminal.

Non-volatile memories and data reading methods thereof

A high voltage level shifting circuit and related semiconductor devices are presented. The circuit comprises: a level conversion circuit that converts an input signal with a first high voltage to an output signal with a second high voltage; a first switch having a first node connected to a first power source and a second node connected to a control node of a first transistor; a second switch having a first node connected to the control node of the first transistor and a second node connected to a first connection node; and a switch control circuit connected to the first switch and the second switch and controls them not to be close at the same time. By adding these two switches to the level conversion circuit, this inventive concept substantially lowers the static current generated during a high voltage level conversion process.

High voltage level shifting (HVLS) circuit and related semiconductor devices

A memory device may include the following elements: a first memory cell; a first word line for transmitting a first control signal to control an electrical connection in the first memory cell; a first bit line connected to the first memory cell; a first transistor, wherein a first terminal of the first transistor is connected to the first bit line; a second memory cell; a second word line for transmitting a second control signal to control an electrical connection in the second memory cell; a second bit line connected to the second memory cell; a second transistor, wherein a first terminal of the second transistor is connected to the second bit line; and a sense amplifier having a first input terminal connected to a second terminal of the first transistor and having a second input terminal connected to a second terminal of the second transistor.

Memory device, related method, and related electronic device

A high voltage level shifter includes a first high-voltage P-channel metal oxide semiconductor (HVPMOS) transistor, a second HVPMOS transistor, a discharge transistor having a first native high-voltage N-channel metal oxide semiconductor (HVNMOS) transistor and a first low-voltage N-channel metal oxide semiconductor (LVNMOS) transistor connected in series, and an avalanche transistor having a second HVNMOS transistor and a second LVNMOS transistor connected in series.

Growing community of inventors

Shanghai, China

Yi Jin Kwon