Lg Electronics Inc.

Aibrain Corporation

Yi Hu

Run Cui

Hyunwoo Kim

Sangyun Kim

Hong Shik Shinn

Jaehong Eom

A product inspection apparatus including a camera configured to capture an image of a product to be inspected; and a processor configured to extract defect information from a defect indicated by the captured image of the product, generate first virtual defect data including at least one of a location, a size and a shape of the defect included in the captured image, based on the extracted defect information, generate second virtual defect data by synthesizing the first virtual defect data with non-defect data representing the product without the defect, and generate final virtual defect data by inputting the second virtual defect data to an artificial intelligence generative model.

Artificial intelligence device and method for generating training data

A system comprises a motor and a base. The motor is configured to control the physical movement of the system and the base is configured to be coupled with a computing device. The computing device is configured to receive an indication of a target object and detect an obstacle object in a physical environment of the system. In response to detecting an obstacle object, the computing device provides to a user an inquiry associated with the detected obstacle object and receives a natural language response. Based at least in part on the natural language response, the computing device controls the motor to navigate the system around the detected obstacle object. Once the target object is detected, the computing device provides an indication that the target object has been located.

Interactive game with robot system

Growing community of inventors

Seoul, South Korea

Yi Hu