Taiwan Semiconductor Manufacturing Comp. Ltd.

Yi-Hsin Chan

Yi-Chin Hsu

Chun-Ching Lin

Yao-Tung Liu

Ming-Hsiu Hsieh

Fu-Kang Lai

Shih-Yung Lo

Wen-Feng Wu

Hung-Chieh Hsu

To allocate products for machines on a manufacturing line, provide a standard test time. Minimize total test time with respect to production scheduling. Form a supply demand matrix table for products and machines for product allocation. Find the grid location with minimum testing time. Provide maximum time allocation from a machine at the corresponding position on the matrix table. Determine the grid location with the next minimum testing time. Loop back to provide a maximum allocation of remaining time from the corresponding machine and repeat looping back until no demand is left. Find need for an optimum testing process by testing whether only one machine can test the product and no quantity is allocated to a machine. If YES branch to calculate utilization per machine. If NO, decide whether N &plus;N &equals;NV . If YES perform optimum testing. If NO, branch to calculate machine utilization per machine.

Method for minimizing total test time for testing factories

A method for providing high availability in a production information system is described. The information system consists of a primary and a secondary copy running on a dual machine architecture. A backup database is added to the system which is updated daily from a transaction log. Database maintenance and archive procedures are performed on the data in the backup database relieving the primary and secondary databases of this activity. Database conversion is performed periodically, and the backup database is used to fill in for the primary and secondary databases when they are being converted.

Production information system enhanced for availability

Growing community of inventors

Hsin-Chu, Taiwan

Yi-Hsin Chan