Taiwan Semiconductor Manufacturing Comp. Ltd.

Yi-Che Chen

Kuo-Yu Chou

Calvin Yi-Ping Chao

Po-Sheng Chou

Honyih Tu

Shang-Fu Yeh

Yi-Ping Chao

Wei Lun Tao

Hon-Yih Tu

Fu-Lung Hsueh

A method for noise simulation of a CMOS image sensor comprises performing a frequency domain noise simulation for a readout circuit of the CMOS image sensor using a computer, wherein the readout circuit includes a correlated double sampling (CDS) circuit, wherein the frequency domain noise simulation includes a CDS transfer function to refer a noise introduced by the CDS circuit back to an input node of the readout circuit. The method further comprises calculating noise at the input node of the readout circuit based on the referred back noises caused by one or more components in the readout circuit and estimating noise of the CMOS imaging sensor by comparing the calculated noise at the input node of the readout circuit to an original input signal to the readout circuit of the CMOS imaging sensor.

Noise simulation flow for low noise CMOS image sensor design

A CMOS sensor includes a pixel configured to output a voltage based on incident light received by the pixel. Circuitry is coupled to the pixel and is configured to determine a reset voltage of the pixel and to select a gain level based on the reset voltage of the pixel. A gain circuit is coupled to the circuitry and is configured to set a voltage level of the gain selected by the circuitry.

Method and systems for amplifying an output of a CMOS pixel array

A readout device comprises a readout circuit having a first switch configured to receive a pixel reset signal, a second switch configured to receive a pixel output signal, and a third switch configured to connect the first switch to the second switch. A first capacitor is connected to the first switch, a second capacitor is connected the second switch, a fourth switch is connected to the first capacitor, and a fifth switch is connected to the second capacitor. The fifth switch is connected to the fourth switch. The readout circuit also comprises a sixth switch connected to the first capacitor and a seventh switch connected to the second capacitor. The sixth switch is configured to provide a first output of the readout circuit, and the seventh is configured to provide a second output of the readout circuit.

Readout device with readout circuit

An apparatus comprises a readout circuit configured to be disconnected from a pixel output, and to connect a pixel reset signal received by the readout circuit to a pixel output signal received by the readout circuit. The apparatus also comprises at least one programmable gain amplifier coupled with the readout circuit. The apparatus further comprises an analog-to-digital converter coupled with the programmable gain amplifier. The readout circuit is configured to be calibrated based on a comparison of a measured output of the readout circuit to a predetermined value, the predetermined value being equal to (2/2)&#x2212;1, where n is the number of bits of the analog-to-digital converter.

Apparatus with calibrated readout circuit

The present disclosure relates to a method and architecture to minimize a transient glitch within a current digital-to-analog converter (DAC) comprising an array of identical current unit cells. The current DAC is configured with individual column decoders for even and odd rows of current unit cells, thus allowing for independent control of adjacent rows. The even row and odd row column decoders further comprise thermal decoders with coupled timing encoding which establishes synergy between an adjacent pair of rows. As current units cells within an active row are activated across the row by a counting up of a first column decoder, the current units cells within a next row adjacent the active row are returned to an initial state of the active row by counting down in a second column decoder. Other devices and methods are also disclosed.

Low glitch current digital-to-analog converter

A method of reducing column fixed pattern noise including calibrating a readout circuit, wherein the readout circuit is electrically connected to at least one programmable gain amplifier and an analog-to-digital converter. Calibrating the readout circuit includes electrically disconnecting the readout circuit from a pixel output and electrically connecting a pixel reset input of the readout circuit to a pixel output signal input of the readout circuit. Calibrating the readout circuit further includes comparing a measured output of the readout circuit to a predetermined value and storing the comparison result in a non-transitory computer readable medium. The method further includes operating the readout circuit, the operating the readout circuit includes receiving a pixel sample signal and outputting a calibrated output based on an operating output and the stored comparison result.

Method of reducing column fixed pattern noise

A CMOS sensor includes a pixel configured to output a voltage based on incident light received by the pixel. A first circuit is coupled to the pixel and is configured to determine a reset voltage of the pixel. A second circuit is coupled to the first circuit and is configured to select a gain level based on the reset voltage of the pixel. A gain circuit is coupled to the second circuit and is configured to set a voltage level of the gain selected by the second circuit.

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Taichung, Taiwan

Yi-Che Chen