Askey Computer Corporation

Princeton Technology Corporation

Yi-Chang Hsu

Ching-Feng Hsieh

Cheng-Yung Teng

Jen-Huan Yu

Wei-Fen Chiang

Jie-Wei Huang

Li-Ying Chang

Chen-Kuo Huang

Jack Lin

A control device having an output pin expansion function and an output pin expansion method thereof are provided. The method includes: connecting at least a shift register unit having a plurality of data transmission pins to a control unit such that the shift register unit can receive strobe signals, a multi-bit data stream, clock signals and enable signals generated by the control unit; sending an enable signal by the control unit so as to allow the shift register unit to shift and store each bit of a multi-bit data stream according to a clock signal generated by the control unit; and sending a strobe signal by the control unit so as to allow the shift register unit to output the multi-bit data in parallel format as opposed to the received serial format through the plurality of data transmission pins, thereby allowing a processing device to interface with more devices (such as LED state indicators) than its fixed number of dedicated output pins would conveniently allow, thus saving costs and board space.

Output pin expansion using shift register receiving data bit each software counted clock for parallel output strobe

The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.

Circuit testing apparatus

A framework of wireless network access device, comprising a communication circuit board with a first electrical connecting portion, a wireless transmission circuit board with a second electrical connecting portion, and at least a signal transmission element connecting with the first and second connecting portions respectively, wherein the signal transmission element is provided for transmitting a signal between the communication circuit board and the wireless transmission circuit board, so as to solve drawbacks of the prior art.

Framework of wireless network access device

A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.

Test system

Signal transmission line connector

Growing community of inventors

Taipei County, Taiwan

Yi-Chang Hsu