Hewlett-Packard Company

Agilent Technologies, Inc.

Yevgeny Kaplun

Edward P Donlon

James L Bertsch

Scot Randy Weinberger

Harvey D Loucks, Jr

Michael Ugarov

William E Barry

Liang Li

Tor C Anderson

Larry Russon

Randy Whittal

Described herein is an ion slicer that: a) accelerates an ion beam towards a first electrode comprising an ion entrance slit, where the first electrode blocks a portion of ions with high displacement from the axis of the ion beam, thereby slicing the ion beam; and then b) decelerates the ion beam after it is sliced.

Ion slicer with accelleration and decelleration optics

A laser desorption ionization instrument for and method of measuring the molecular weight of large organic molecules includes a time of flight mass spectrometer (TOF MS). The TOF MS instrument provides optimized optic design for both DC and TLF modes. The invention further provides dynamic resolution enhancement for a given ejection pulse, along with optimized ion ejection pulses relative to the ion optic elements. The invention also provides means for compensating for difference in total kinetic energy among ions of different mass; high resolution detection means for improved sensitivity for large molecular weight species. The invention further provides x-y-z stage for sample presentation of both standard MALDI and gel or membrane based samples.

Device for time lag focusing time-of-flight mass spectrometry

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Mountain View, CA, United States of America

Yevgeny Kaplun