Hyundai Mobis Co., Ltd.

Yeong Jun Cho

Tae Hyun Kim

Hye Rin Kim

The present disclosure in some embodiments provides a product inspection method and a system based on deep learning for detecting a product defect. The present disclosure provides a product inspection method and system for detecting product defects by linking a predeveloped deep learning-based classification model to interwork with the existing product inspection system while fine-tuning the classification model to be maintained or supplemented by instantly correcting errors of the classification model, thereby improving the accuracy of product quality inspection.

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Gwangju, South Korea

Yeong Jun Cho