Test Research, Inc.

Benano Inc.

Yeong-Feng Wang

Liang-Pin Yu

Kuang-Pu Wen

Chun-Di Chen

Chih-Tien Tsai

Yun-Ping Kuan

A three-dimensional scanning system includes a projection light source, an image capturing apparatus, and a signal processing apparatus. The projection light source is configured to project a two-dimensional light to a target, where the two-dimensional light has a spatial frequency. The image capturing apparatus captures an image of the target illuminated with the two-dimensional light. The signal processing apparatus is coupled to the projection light source and the image capturing apparatus, to analyze a definition of the image of the two-dimensional light, where if the definition of the image of the two-dimensional light is lower than a requirement standard, the spatial frequency of the two-dimensional light is reduced.

Three-dimensional scanning system

An apparatus for three-dimensional shape measurement is provided, including a projection device, an image capture device, and an image processing device. The projection device sequentially projects a plurality of structured light beams on a scene during a first projection period and a second projection period. The mean level of the structured light beams during the first projection period is the same as the mean level of the structured light beams during the second projection period, and the frequency of the structured light beams during the first projection period is different from the frequency of the structured light beams during the second projection period. The image capture device captures an image of the scene within the projection time of each of the structured light beams. The image processing device obtains a three-dimensional shape of a to-be-measured object in the scene according to the images.

Apparatus for three-dimensional shape measurement

An optical inspection apparatus includes a dichroic mirror, a first light source, and a first image capturing device. The dichroic mirror has a first side and a second side opposite to the first side. The dichroic mirror transmits a first light beam and reflects a second light beam. The wavelength of the second light beam is different from the wavelength of the first light beam. The first light source is disposed at the first side of the dichroic mirror and is configured to provide the first light beam to pass through the dichroic mirror. The first image capturing device is disposed at the second side of the dichroic mirror and is configured to detect the second light beam reflected from the dichroic mirror.

Optical inspection apparatus

An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.

Optical inspection system

An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.

Inspecting device and method for inspecting inspection target

An optical system includes an optical apparatus. The optical apparatus is for projecting a first projection image to a plane or detecting a first detected image of the plane. The optical apparatus includes a first image device, and a lens group. The first image device has an image surface having an image center. The lens group is disposed between the first image device and the plane and has a lens axis surface and an optic center. The optic center and the image center form a connection line. The plane has a tangent surface to an intersecting point of the connection line. The lens axis surface, the tangent surface, and an extension surface of the image surface substantially intersect at a straight line.

Optical system and image compensating method of optical apparatus

An optical system includes at least one optical apparatus. The optical apparatus includes a first light source, a second light source, and a dynamic switch. The first light source is configured for providing a first light beam. The second light source is configured for providing a second light beam. The dynamic switch includes a plurality of mirrors arranged in an array manner. Each of the mirrors has a first tilt angle and a second tilt angle. The first light beam and the second light beam impinge on the dynamic switch from different directions. The dynamic switch reflects the first light beam to a desired position when the mirrors are at the first tilt angles, and reflects the second light beam to the desired position when the mirrors are at the second tilt angles.

Growing community of inventors

Taipei, Taiwan

Yeong-Feng Wang