Korea Institute of Science and Technology

Koh Young Technology Inc.

Hyundai Motor Company

Seoul National University

Youlchon Chemical Co., Ltd.

Samsung Electronics Co., Ltd.

Yeon Hee Lee

Seung Hee Han

Hye Won Lee

Hyun Cheol Park

Yong Yeon Lee

Jong Hui Lee

Seung Ae Seo

Won Mi Ahn

Hye In Lee

Kang Bong Lee

Jang Seop Kim

Yun Sik Nam

Jwa-Min Nam

Jeong-Eun Park

In Bae Jung

Oleksandr Tsymbalenko

Gyu Jin Ha

Su Jin Yeon

Jung Hyun Shim

A method for preparing a metal nanocube with a controlled corner sharpness index includes a step of reacting with a first surfactant and a predetermined surface-protecting agent. A method for preparing a metal nanocube aggregate having a purity of 95% or more includes a step of centrifuging in the presence of a second surfactant. A probe composition includes the metal nanocube or metal nanocube aggregate prepared by the method; and a gold (Au) nanocube having an average edge length of 20 nm or less.

Method for preparing metal nanocube with controlled corner sharpness index

The present disclosure relates to an ammonia gas detection sensor including a substrate, a graphene sheet disposed on the substrate, and metal nanoparticles disposed on the graphene sheet, and an ammonia gas detection device comprising the gas detection sensor.

Ammonia gas detecting sensor using graphene doped with copper oxide nanopaticles and ammonia gas detecting device comprising the same

A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.

Substrate inspection method and system

Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.

Substrate inspection apparatus and method

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An apparatus for generating ozone in high concentration with efficiency and linearly controlling the concentration of ozone is disclosed. The apparatus includes an oxygen generator, a flat plate type ozone generator, a high-voltage transformer, a high-frequency inverter, a cooling-water supplier, and a control signal generator. The high-frequency inverter linearly controls the concentration of ozone by applying a high-frequency voltage pulse generated according to a predetermined ON/OFF time ratio corresponding to a voltage level of a control signal, to the flat plate type ozone generator through the high-voltage transformer. The flat plate type ozone generator uses a flat plate type ceramic as dielectrics, thereby optimizing the efficiency of ozone generation and the endurance of the ozone generator, and thus simultaneously miniaturizing dimension thereof.

Apparatus for generating ozone in high concentration

A method for surface modification of 3-dimensional bulk polymers is provided to improve surface properties and surface conductivity of 3-dimensional bulk polymers by using plasma source ion implantation technique. The plasma source ion implantation technique is to modify the surface by implanting ions into the surface of the 3-dimensional samples uniformly. When negative high voltage pulse is applied to a metallic grid around the bulk polymer samples, ions are extracted from the plasma; most of ions passing the grid and collide with the surface of the bulk polymer samples in high energy. Therefore, through the method for applying high voltage pulse to the grid around samples, ions are implanted into the surface of the 3-dimensional bulk polymer samples uniformly, and thereby the ions implanted in high energy modify the bulk polymer surface to improve the electrical conductivity effectively.

Method for surface modification of 3-dimensional bulk polymers

Growing community of inventors

Seoul, South Korea

Yeon Hee Lee