Ememory Technology Inc.

Yen-Tai Lin

Ching-Yuan Lin

Chien-Hung Ho

Shih-Jye Shen

Ching-Hsiang Hsu

Ching-Sung Yang

Ming-Chou Ho

Chen-Hao Po

Chun-Hung Lu

Jie-Hau Huang

Yu-Ming Hsu

Chih-Hsun Chu

Hong-Yi Liao

Lung-I Chiue

Way-Chen Wu

Ching-Shan Chien

Shih-Yun Lin

A voltage level shifting apparatus is disclosed. The voltage level shifting apparatus has a cross-coupled transistor pair, a plurality of transistor pairs, a first diode string, a second diode string and an input transistor pair. One of the transistor pairs is coupled to the cross-coupled transistor pair, and the transistor pairs are controlled by a plurality of reference voltages. The first and the second diode strings are coupled between two of the transistor pairs. Each of the first and the second diode strings has at least one diode. The input transistor pair receives a first and a second input voltage, and the first and second input voltages are complementary signals. The cross-coupled transistor pair generates and outputs a first output voltage and a second output voltage by shifting the voltage level of the first and the second input voltage.

Voltage level shifting apparatus

A P-channel non-volatile memory is described. The P-channel non-volatile memory includes a substrate, a first memory cell, and second memory cell. An N-well is disposed over the substrate, and the first cell and the second cell are disposed over the N-well. The first memory cell includes a first gate, a first charge storage structure, a first doped region and a second doped region. The first doped region and the second doped region are disposed in the substrate on the respective sides of the first gate. The second cell includes a second gate, a second charge storage structure, a third doped region, and the second doped region. The third doped region and the second doped region are disposed in the substrate on the respective sides of the second gate. The second cell and the first cell share the second doped region.

Operating method of P-channel non-volatile memory

A voltage regulator has a first charge circuit, a second charge circuit, and a control circuit. The control circuit has five input terminals and two output terminals. The five input terminals are respectively coupled to a reference voltage, a first voltage source, a second voltage source, an output terminal of the first charge circuit, and an output terminal of the second charge circuit. The control circuit equalizes a voltage difference between the output terminal of the first charge circuit and the first voltage source and a voltage difference between the second voltage source and the output terminal of the second charge circuit.

Voltage regulator outputting positive and negative voltages with the same offsets

A non-volatile memory array including a plurality of memory units is provided. Each memory unit is serially connected with a select transistor and a memory cell. A source region is next to the select transistor while a drain region is next to the memory cell. The drain lines are arranged in parallel in column direction and connected with the drain regions of the memory units in one column. The bit lines are arranged in parallel in row direction and connected with the source regions of the memory units in one row. The word lines are arranged in parallel in column direction and connected with the select gates of the memory units in one column. The control lines are arranged in parallel in column direction and connected with the control gates of the memory units in one column. The control lines are grouped by two and electrically connected with each other.

Non-volatile memory array

The present invention provides a method for accessing a memory. The memory contains M one-time programmable memory blocks, and each has a first memory sector and a second memory sector. The method includes: selecting a first target memory block and reading the first target memory block. The step of selecting a first target memory block is performed by comparing the second memory sectors of N one-time programmable memory blocks from M one-time programmable memory blocks by following a search rule to select the first target memory block.

Method for accessing memory

A method for controlling a non-volatile dynamic random access memory provides a non-volatile dynamic random access memory having a storage unit and a control unit. The storage unit has a floating gate for storing charges and a control gate for receiving an operating voltage to determine whether a channel is induced on the surface of a substrate. The channel corresponds to a number of charges stored on the floating gate. A parasitic capacitor exists between the storage unit and the control unit, and a capacitance of the parasitic capacitor increases when the channel has been induced. The method includes applying a first predetermined voltage to the control unit and measuring a voltage variance generated by the parasitic capacitor to analyze data stored by the storage unit.

Method for controlling a non-volatile dynamic random access memory

A power supply used for providing a flash memory with an operating voltage has a plurality of memory blocks and a plurality of decoders corresponding to the memory blocks. Each memory block has a plurality of memory cells for storing binary data. Each decoder is used for selecting memory cells in the corresponding memory block. The power supply has at least three power sources for generating different voltages, and controls the power sources for making a voltage difference between a high voltage level and a low voltage level of the unselected decoder less than a voltage difference between a high voltage level and a low voltage level of the selected decoder.

Power supply device with reduced power consumption

An option fuse circuit using standard CMOS manufacturing processes includes a latch for latching signals, which includes a first node and a second node. The option fuse circuit also includes a comparator, which includes two input nodes and an output node. The comparator receives signals input at the two input nodes from the first and the second nodes, and compares the two signals in order to output a comparison signal. The option fuse circuit further includes two logic cells for storing non-volatile data. The logic cells include a word line node and a bit line node. The word line nodes are electrically connected to the output node of the comparator, while the bit line nodes are electrically connected to the first and the second nodes, respectively.

Option fuse circuit using standard CMOS manufacturing process

An electrically erasable programmable logic device (EEPLD) includes a P type semiconductor substrate. An N type well is formed on the P type semiconductor substrate. A first PMOS transistor is formed on the N well. The first PMOS transistor comprises a floating gate, a first P doped region serving as a drain of the first PMOS transistor, and a P doped region encompassing an N doped region for erasing the first PMOS transistor. A second PMOS transistor is also formed on the N well and serially connected to the first PMOS transistor. The first P doped region functions as a source of the second PMOS transistor, and the second PMOS transistor further comprises a select gate and a second P doped region serving as a drain of the second PMOS transistor.

Electrically erasable programmable logic device

A level shift circuit for shifting an input voltage to an output voltage is provided. The level shift circuit includes at least a complementary metal oxide semiconductor (CMOS) transistor formed on a p-substrate. The CMOS transistor has a PMOS transistor and an NMOS transistor. The NMOS transistor includes a gate electrode, a drain electrode having an n-well formed on the p-substrate and a first n-doped region formed inside the n-well, and a source electrode having a second N-doped region formed on the p-substrate.

Level shift circuit without junction breakdown of transistors

A word line driver includes an address decoder having a first circuit and a second circuit for selecting the word line, and a control end disposed between the first circuit and the second circuit. In addition, the word line driver has a level shift circuit for shifting a voltage level of the word line, and the level shift circuit has an input end connected to the second circuit of the address decoder. A method of driving a word line includes shifting a voltage level of the control end while turning on the second circuit so as to shift a voltage level of the input end of the level shift circuit, and shifting a voltage level of at least one of the first and second power supplies and using the second circuit to isolate the voltage level of the control end from the voltage level of the word line.

Method using a word line driver for driving a word line

A page buffer for a flash memory has a power supply, a latch circuit, and a plurality of switches. Initially the switches are controlled for resetting a first terminal and a second terminal of the latch circuit to a respective predetermined voltage. If a memory cell is not to be programmed, the voltage levels of the first terminal and the second terminal remain unchanged when the power supply outputs a programming voltage. If the memory cell is to be programmed, the voltage levels of the first terminal and the second terminal are changed when the power supply outputs the programming voltage. Each of the first terminal and the second terminal will regain the predetermined voltage after the memory cell is completely programmed to store a predetermined binary digit.

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Hsin-Chu, Taiwan

Yen-Tai Lin