Industrial Technology Research Institute

National Applied Research Laboratories

Yen-Song Chen

Wei-En Fu

Wen-Li Wu

Hsin-Chia Ho

Yun-San Chien

Chi-Hung Huang

Yen-Pei Lu

Yih-Sharng Chen

Rui-Cian Weng

Te-I Chang

Kuan-Yin Yu

A surgical image pickup system utilizes an adjustable lens set and a complex lens set to change the direction of the incident light emitted from the light source and the position of the surgical site on which the incident light projects. The eyepiece and the sensor have the same field of view and the same optical axis such that first image generated by the sensor and a second image generated by the eyepiece are the same. The sensor transmits the first image to the external display for display by wireless communication. By means of the foregoing configuration, the second image which doctor utilizes the eyepiece to see and the first image which the external display displays are the same, thereby facilitating the operation of surgery.

Surgical image pickup system

The disclosure provides an apparatus for aligning first and second plates that are parallel to each other and have the same orientation. The apparatus includes a detector that detects composite small-angle X-ray scattering emitted from patterns of the first and second plates that are perpendicularly impinged by X-ray, and a moving unit that aligns the first and second plates according to a composite amplitude distribution of the composite small-angle X-ray scattering. Therefore, the first and second plates are aligned to each other accurately.

Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements

An apparatus and methods for small-angle electron beam scattering measurements in a reflection or a backscattering mode are provided. The apparatus includes an electron source, electron collimation optics before a sample, electron projection optics after the sample, a sample stage capable of holding the sample, and a electron detector module. The electrons emitted from the source are collimated and positioned to impinge nanostructures on the sample. The signals resulting from the interactions between the impinging electrons and the nanostructures are further magnified by the electron projection optics to reach a sufficient angular resolution before recorded by the electron detector module.

Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate

Growing community of inventors

Taipei, Taiwan

Yen-Song Chen