Yangtze Memory Technologies Co., Ltd.

Ye Tian

Yu Wang

Haibo Li

Ke Jiang

Zhichao Du

Zhi Chao Du

Xiaojiang Guo

Jin Yong Oh

Siyuan Wang

ZhiChao Du

A memory device is disclosed. The memory device may include a memory string and a peripheral circuit. The memory string may include a drain select gate (DSG) transistor, a plurality of memory cells, and a source select gate (SSG) transistor. The peripheral circuit may be coupled to the memory string and configured to, during a program operation on a select memory cell of the plurality of memory cells: after detecting an interrupt signal, perform a clean process that includes turning on at least one of the DSG transistor or the SSG transistor.

Memory device and program operation thereof

A method for operating a three-dimensional (3D) memory device includes performing a first read operation for sensing a first memory cell of a first transistor string, and performing a subsequent second read operation for sensing a second memory cell of a second transistor string. Performing the first read operation includes applying a first bit line voltage to a first bit line, and maintaining the first bit line basically undischarged after data state of the first memory cell is detected.

Three-dimensional memory device and improved methods of reading the same by shortening read times

In certain aspects, a memory device includes a memory string including a drain select gate (DSG) transistor, a plurality of memory cells, and a source select gate (SSG) transistor, and a peripheral circuit coupled to the memory string. The peripheral circuit is configured to in response to an interrupt during a program operation on a select memory cell of the plurality of memory cells, turn on at least one of the DSG transistor or the SSG transistor. The peripheral circuit is also configured to suspend the program operation after turning on the at least one of the DSG transistor or the SSG transistor.

A memory system includes a memory cell array and a controller coupled to the memory cell array. The controller is configured to control applying a first program voltage to a word line to program memory cells in the memory cell array, the memory cells being coupled to the word line, and in response to receiving a suspend command, control applying a positive bias discharge voltage to the word line when the first program voltage ramps down.

Control method and controller of program suspending and resuming for memory

Read time of three-dimensional memory device

A control method, for a memory array, the control method comprises programming the bit-cell of the memory array in a programming stage; and discharging the bit-cell of the memory array in a discharge stage; wherein the programming stage comprises: programming the bit-cell of the memory array with a plurality of programming voltage pulses; wherein the discharge stage comprises: isolating a select line of the bit-cell of the memory array; and generating a programming voltage pulse to the bit-cell of the memory array; wherein the programming stage can be suspended to a suspend stage by a suspend command after the discharge stage; wherein the suspend command is received during one of the plurality of programming voltage pulse.

Growing community of inventors

Wuhan, China

Ye Tian