Avago Technologies General IP (singapore) Pte. Ltd.

Avago Technologies Fiber IP (singapore) Pte. Ltd

Agilent Technologies, Inc.

Acea Biosciences, Inc.

Anchor Semiconductor Inc.

Foxconn Interconnect Technology Limited

Avago Technologies International Sales Pte. Limited

Ye Chen

Bing Shao

Xiaobo Wang

Nan Li

Yue Ma

Seng-Kum Chan

Khurram Zafar

Justin Chen

Abhishek Vikram

Ping Zhang

Chenmin Hu

Li Ding

Ronald T Kaneshiro

Jian Wu

Chung-Yi Su

David J K Meadowcroft

Christopher L Coleman

Tianxing Wang

Ron Kaneshiro

Craig T Cummings

Rong Lv

Yuan Xu

Tak Kui Wang

Hyunsun Chung

Tak Kai Wang

Frank David Yashar

Pengyue Wen

Andrew Schmit

Penyue Wen

Zengqiang Li

Chingyun Hsiang

Raymond Xu

Omid Momtahan

Xiaozhong Wang

Dongqing Cao

James Joseph Dudley

Myunghee Lee

Kit M Cham

Stefano G Therisod

Hui Xu

David Chak Wang Hui

Jared D Stack

Kit Cham

Yu-Chun Chang

Albert Wooi-Quan Khor

Tak-Kui Wang

Pattern centric process control is disclosed. A layout of a semiconductor chip is decomposed into a plurality of intended circuit layout patterns. For the plurality of intended circuit layout patterns, a corresponding plurality of sets of fabrication risk assessments corresponding to respective ones of a plurality of sources is determined. Determining a set of fabrication risk assessments for an intended circuit layout pattern comprises determining fabrication risk assessments based at least in part on: simulation of the intended circuit layout pattern, statistical analysis of the intended circuit layout pattern, and evaluation of empirical data associated with a printed circuit layout pattern. A scoring formula is applied based at least in part on the sets of fabrication risk assessments to obtain a plurality of overall fabrication risk assessments for respective ones of the plurality of intended circuit layout patterns. The plurality of intended circuit layout patterns is ranked based on their fabrication risk assessments, the corresponding overall fabrication risk assessments, or both. At least a portion of ranking information is outputted to facilitate influence or control over the semiconductor fabrication process.

Pattern centric process control

A system for detecting signal components of light induced by multiple excitation sources including: a flow channel including at least two spatially separated optical interrogation zones; a non-modulating excitation source that directs a light beam of a first wavelength at a near constant intensity onto a first of the optical interrogation zones; a modulating excitation source that directs a light beam of a second wavelength with an intensity modulated over time at a modulating frequency onto a second of the optical interrogation zones; a detector subsystem comprising a set of detectors configured to detect light emitted from particles flowing through the at least two optical interrogation zones and to convert the detected light into a total electrical signal; and a processor that determines signal components from the light detected from each of the optical interrogation zones.

System and method for detecting multiple-excitation-induced light in a flow channel

A freeform DOE for use in an optical transmitter and a method of designing and manufacturing the DOE are provided. The freeform DOE is capable of achieving the same, or nearly the same, functionality as that of a glass DOE, but has a design that has been transformed to make the surface profile of the DOE compatible with a molding process that can be used to manufacture the DOE with high quality at low costs. The method of designing and manufacturing the DOE includes preselecting a CGH that will obtain a target freeform DOE design, using a preselected smoothing function to smooth the surface profile of the target freeform DOE design to transform the design into a DOE design that is compatible with a molding process, and using a fabrication process to manufacture a freeform DOE that is based on the transformed DOE design.

Freeform diffractive optical element (DOE) for use in an optical transmitter and method of designing and manufacturing the freeform DOE

A system for detecting signal components of light induced by multiple excitation sources, which includes a flow channel having two spatially separated optical interrogation zones; a light illumination subsystem that directs each of two light beams of different wavelengths to a different zone of the optical interrogation zones; a detector subsystem that converts detected light into a total electrical signal having both modulated and unmodulated electrical signals; and a processor that determines signal components from the light detected from each of the optical interrogation zones.

An optics system is provided that comprises a glass-based diffractive optical element (DOE) for coupling an optical signal passing out of an optical waveguide into a photodetector. The glass-based DOE improves optical link performance by performing one or more of shortening a response time of a photodetector, preventing an overloading condition of the photodetector from occurring and managing back reflection of light from the photodetector. The glass-based DOE is relatively inexpensively to manufacture and is reliable over a wide range of temperatures.

Optical communications module having an optics system that improves link performance, and methods

An optical engine for use in a bench top flow cytometer, the optical engine comprising a set of lasers; a different set of beam shaping optics for each laser, wherein each set comprises two lenses to adjustably focus light horizontally along an x-axis to a same horizontal position and vertically along a y-axis to a different vertical position along a same plane; collection optics for collecting fluorescence from the flow cell; filtration optics that filter the collected fluorescence from the flow cell into different detection channels according to wavelength ranges; and a detector for each detection channel that converts the filtered fluorescence to electrical signals, wherein electrical signals are processed so that the fluorescence from each laser at the different vertical positions is distinguished at the same detector.

Optical engine for flow cytometer, flow cytometer system and methods of use

Tracking patterns during a semiconductor fabrication process includes: obtaining an image of a portion of a fabricated device; extracting contours of the portion of the fabricated device from the obtained image; aligning the extracted contour to a matching section of a reference design; decomposing the matching section of the reference design into one or more patterns; and updating a pattern tracking database with information pertaining to at least one pattern in the one or more patterns generated as a result of the decomposition.

Pattern weakness and strength detection and tracking during a semiconductor device fabrication process

An optical communications module is provided that has WDM capabilities for increased bandwidth and that is suitable for use with single mode optical fiber or multimode optical fiber. The module can be configured to have both WDM and BiDi functionality to further increase bandwidth and can have a single- or multi-channel configuration. The module has an integrally-formed body having an optical port and portions of an optical coupling system that are integrally formed in the body. The optical port is adapted to mate with an end of an optical fiber cable that holds one or more ends of one or more optical fibers, depending on whether the module is a single-channel or multi-channel module. The optical coupling system couples light between an end or ends of one or more optical fibers and one or more optoelectronic devices in a way that reduces back reflection and mode partition noise.

Wavelength division multiplexing and demultiplexing in optical communications modules, and methods

A constructed photodetector, an optical receiver, and a receiver unit in an optical communication system are disclosed. One example of the disclosed constructed photodetector includes an optoelectronic element having an active area that converts light having a wavelength of interest into electrical signals and a substrate on a face that opposes the active area, where the substrate is non-transparent to light having the wavelength of interest. The constructed photodetector further includes a lens-chip that is at least partially transparent to light having the wavelength of interest, where the lens-chip includes a first side and an opposing second side, where the first side of the lens-chip includes an integrated lens, and where the second side of the lens-chip includes one or more electrical traces. The constructed photodetector further includes at least one connector that provides a physical and electrical connection between the optoelectronic element and the lens-chip.

Optical receiver using a photodetector with a self-aligned lens

Bidirectional parallel optical transceiver modules for use in optical links and methods for communicating bidirectionally over the links are provided. The bidirectional parallel optical transceiver modules have features that ensure relatively low optical crosstalk, relatively low return loss and relatively high SNR. In addition, the modules have an in-line, zig-zag configuration that allows the modules to be compact and to have high bidirectional channel density for achieving high bandwidth.

Bidirectional parallel optical transceiver module and a method for bidirectionally communicating optical signals over an optical link

Growing community of inventors

San Jose, CA, United States of America

Ye Chen