Rigaku Corporation

Yayoi Taniguchi

Keiichi Morikawa

An X-ray analysis assistance device with an input and operation devicefor arbitrarily inputting and setting the value of one from among the distance L between a sample S and a two-dimensional detectorand the maximum detection range Xmax for X-rays scattered or diffracted by the sample S, and a central processing unitfor automatically setting the other setting item on the basis of the value of the one setting item set by the input and operation device. Further, the maximum measurement frame Hmax for the X-rays is displayed on a display screenof a display deviceon the basis of the distance L and maximum detection range Xmax. Additionally, an X-ray detection area A indicating the range within which it is possible for the detection surface of the two-dimensional detectorto detect X-rays is displayed on the display screenof the display device

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Tokyo, Japan

Yayoi Taniguchi