Hitachi-high-technologies Corporation

Hitachi Medical Corporation

Yayoi Shitara

Masato Suzuki

Takashi Noguchi

Masaki Takano

Tatsuya Tokunaga

Naomi Ishii

Yuki Fukuyama

Maiko Kawase

Tatsuya Tokunga

A management server of a sample inspection system includes sample processing information generated on the basis of inspection request data, facility data, a simulation execution portion and a window generation portion for generating a monitor window. The inspection request data contains a priority, an order time, a required time and inspection items and the sample processing information contains an inspection start time and an inspection estimate finish time. The monitor window has a work area in which the samples represented by sample bars parallel to the abscissa are arranged in a vertical direction and a past record and a future schedule are allocated to this abscissa with the present time as the base. The sample bars display a simulation execution portion for executing simulation on the basis of the inspection start time, the inspection estimate finish time and a delay time. The management server displays the simulation result.

Sample inspection system and operating method for management server thereof

An examination information display device of the present invention includes: a storage unit that stores examination information of an object; a display unit that has a display screen on which the examination information is displayed; an extraction unit that extracts candidate examination information, which is a candidate referred to or compared with a reference examination to be diagnosed, using supplementary information of the examination information of the object stored in the storage unit; and a display control unit that displays the candidate examination information in a predetermined display region of the display screen.

Examination information display device and method

Growing community of inventors

Tokyo, Japan

Yayoi Shitara