Panasonic Corporation

Yayoi Okui

Seigo Shiraishi

Kojiro Okuyama

Osamu Inoue

Masahiro Sakai

Keisuke Okada

The blue phosphor of the present invention is represented by the general formula aBaO.bSrO.(1&#x2212;a&#x2212;b)EuO.cMgO.dAlO.eWO, where 0.70&#x2266;a&#x2266;0.95, 0&#x2266;b&#x2266;0.15, 0.95&#x2266;c&#x2266;1.15, 9.00&#x2266;d&#x2266;11.00, 0.001&#x2266;e&#x2266;0.200, and a+b&#x2266;0.97 are satisfied. In the blue phosphor of the present invention, two peaks whose tops are located in a range of diffraction angle 2&#x3b8;=13.0 to 13.6 degrees and one peak whose top is located in a range of diffraction angle 2&#x3b8;=14.6 to 14.8 degrees are present in an X-ray diffraction pattern obtained by measurement on the blue phosphor using an X-ray with a wavelength of 0.774 &#x212b;.

Blue phosphor, and light-emitting device using the same

The blue phosphor of the present invention includes ZrOand a metal aluminate that is represented by the general formula aBaO.bSrO.(1&#x2212;a&#x2212;b)EuO.cMgO.dAlO.eWO, where 0.70&#x2266;a&#x2266;0.95, 0&#x2266;b&#x2266;0.15, 0.95&#x2266;c&#x2266;1.15, 9.00&#x2266;d&#x2266;11.00, 0.001&#x2266;e&#x2266;0.200, and a+b&#x2266;0.97 are satisfied. This blue phosphor has a ZrOcontent of 0.01 to 1.00% by weight. In the blue phosphor of the present invention, two peaks whose tops are located in a range of diffraction angle 2&#x3b8;=13.0 to 13.6 degrees are present in an X-ray diffraction pattern obtained by measurement on the blue phosphor using an X-ray with a wavelength of 0.774 &#x212b;.

The present invention aims to provide a manufacturing method for a PDP which allows even high-definition and ultra-high-definition PDPs to demonstrate an excellent image display capability at improved luminous efficiency, by suppressing variation of a discharge gas composition, and by eliminating an impurity gas in a discharge space effectively. To achieve the aim, deterioration of an absorbent materialcomposed of copper ion-exchanged ZSM-5-type zeolite is prevented, by performing both sealing and evacuation steps for the front substrateand back substratein a non-oxidizing gas atmosphere. This maintains properties of the absorbent materialfor absorbing the impurity gas without degradation, even if the absorbent materialabsorbs a Xe gas in a discharge gas introducing step.

Manufacturing method for plasma display panel

The present invention provides a phosphor with high luminance and color purity. The phosphor of the present invention is represented by the general formula: aYO&#xb7;(3&#x2212;a)CeO&#xb7;bAlO&#xb7;cGaO, where 2.80&#x2266;a&#x2266;2.99, 1.00&#x2266;b&#x2266;5.00, 0&#x2266;c&#x2266;4.00, and 4.00&#x2266;b+c&#x2266;5.00 are satisfied. In the phosphor, a peak whose peak top is located in the range of diffraction angle 2&#x3b8; of not less than 16.7 degrees but not more than 16.9 degrees is present in an X-ray diffraction pattern obtained by measurement on the phosphor using an X-ray with a wavelength of 0.774 &#x212b;.

Stoichiometric phosphor, and light emitting device and plasma display panel utilizing the phosphor

A plasma display panel () of the present invention includes a first panel () and a second panel (). A discharge space () is formed between the first panel () and the second panel (). In the plasma display panel (), an electron emitting material () is disposed to face the discharge space (). The electron emitting material () contains Sn, an alkali metal, O (oxygen), and at least one element selected from the group consisting of Ca, Sr, and Ba.

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Osaka, Japan

Yayoi Okui