Jfe Steel Corporation

Sumco Corporation

Yasuyuki Morikawa

Yusuke Tanaka

Toshifumi Kodama

Akinori Murao

Naoshi Yamahira

Daiki Fujiwara

Disclosed is a method of manufacturing a bonded wafer, wherein a terrace forming step is carried out using a chamfering wheel which comprise a low grit number grinding stone and a high grit number grinding stone having a higher grit number than the low grit number grinding stone, and wherein the terrace forming step comprises: a coarse chamfering step of chamfering, after chamfering the active layer wafer, the insulating film from the active layer wafer side and further chamfering the support substrate wafer, using the low grit number grinding stone; and a finish chamfering step of finish chamfering, after the coarse chamfering step, a machined surface obtained from the coarse chamfering step, using the high grit number grinding stone.

Method of manufacturing bonded wafer

A method of detecting an abnormality in a blast furnace, wherein the abnormality causes clogging of a tuyere unit of the blast furnace, the method including capturing an image of a raceway unit through an in-furnace monitor window disposed at the tuyere unit; and determining that the abnormality has occurred when a brightness of the captured image is lower than or equal to a predetermined brightness threshold and a rate of decrease in the brightness is lower than or equal to a predetermined brightness-decrease-rate threshold.

Method of detecting abnormality at blast furnace and method of operating blast furnace

Growing community of inventors

Tokyo, Japan

Yasuyuki Morikawa