Seiko Precision Inc.

Yasutoshi Chiba

Hiroshi Takahashi

Akira Ito

Yoichi Nakano

Kenichi Kudo

Koichi Masuzawa

An imaging device includes: an image pickup unit including an image pickup element and a control substrate mounted with the image pickup element; and a shutter unit including a blade for adjusting an amount of light reaching the image pickup element and a drive source for driving the blade. The shutter unit includes a terminal portion electrically connected to a coil of the drive source. The terminal portion extends outward from the shutter unit and is electrically connected to the control substrate. The terminal portion and the image pickup unit include alignment means for aligning these each other. The shutter unit is aligned with the image pickup unit via the terminal portion.

Imaging device with alignment means for aligning shutter unit and imaging unit

A reflection-type optical sensor is provided wherein misjudgment is prevented in detecting the existence of an object and determining whether a distance to the object is large or small. A housing is molded from white polycarbonate resin and has a light-projecting portion and a light-receiving portion. A light-projecting lens and a light-emitting device are mounted in a light-projecting chamber formed in the light-projecting portion. A light-receiving lens and a light-receiving device are mounted in a light-receiving chamber formed in the light-receiving portion. Those of the wall surfaces of the light-projecting chamber and the light-receiving chamber which are illuminated with light are light reflection-promoting surfaces that promote the reflection of light. The light reflection-promoting surfaces can be smooth surfaces, surfaces painted in white, inner surfaces of auxiliary members fabricated as separate parts from aluminum, or the like.

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Chiba, Japan

Yasutoshi Chiba