Mitsubishi Denki Kabushiki Kaisha

Mitsubishi Electric Corporation

Yasushi Uehara

Shigeru Aihara

Daigo Takemura

Kenro Mitsuda

Kazuki Kubo

Osamu Hiroi

Teruo Shibano

The present invention relates to an electric double-layer capacitor and a method for producing same capable of evenly and rapidly doping a negative electrode layer with lithium ions. The electric double-layer capacitor comprises: a positive electrode including a positive electrode layer formed on one surface of a positive electrode current collector; a negative electrode including a negative electrode layer formed on one surface of a negative electrode current collector; a first separator disposed between the positive electrode layer and the negative electrode layer; and a second separator disposed between the positive electrode current collector and the negative electrode current collector, in which the negative electrode includes holes penetrating through the negative electrode current collector and reaching the negative electrode layer.

Electric double-layer capacitor including holes penetrating a negative electrode current collector and method of producing same

A fluorescent X-ray analysis apparatus includes: an X-ray generation source for radiating a beam of primary X-rays; spectroscopic elements circularly arranged so that their inner surfaces describe a circle centered on an optical axis of the beam of primary X-rays for monochromatizing the beam of primary X-rays and condensing the beam on a surface of an irradiation object; a spectroscopic element position adjuster for adjusting the positions of the spectroscopic elements; secondary X-rays detector for detecting secondary X-rays radiated from the surface of the irradiation object irradiated with the monochromatized beam of primary X-rays; a secondary X-ray detector position adjuster adjusting the position of the secondary X-ray detector; an irradiation object surface position detector detecting the position of the surface of the irradiation object; and a controller adjusting the positions of the spectroscopic elements through the spectroscopic element position adjuster to condense the monochromatized beam of primary X-rays on the surface of the irradiation object, on the basis of the position of the surface of the irradiation object detected by the irradiation object surface position detector.

Fluorescent X-ray analysis apparatus

Growing community of inventors

Tokyo, Japan

Yasushi Uehara