Olympus Optical Company, Ltd.

Ando Electric Company

Yasushi Satoh

Yuzo Nakamura

Takao Okada

Hiroshi Kajimura

Hirofumi Miyamoto

Haruyoshi Uchiyama

Toshio Kurashima

Koichi Karaki

Kiyoshi Fujii

Tsugiko Takase

Shuzo Mishima

Fumio Uchino

Masahiro Ohno

Hiroko Ohta

Soji Yamamoto

Hitoshi Tateoka

Kanae Nakasato

Zhixien Li

Toshiaki Matsuzawa

Yoshimitsu Enomoto

Jun-ichi Ishibashi

An object of the present invention is to provide an optical fiber strain measuring apparatus which can perform precise measurement without causing any fluctuation in signal level. To achieve the above object the present invention comprises: a polarization plane rotation device 105 which rotates a plane of polarization of an optical pulse; a photo-directional coupler 106 which projects an optical pulse projected from the polarization plane rotation device 105 into an optical fiber 107 to be measured, and projects out backscattering light produced in the optical fiber 107 to be measured; a polarization plane rotation device 160 which rotates a plane of polarization of a reference light; a light mixing device 109 for mixing the backscattering light projected out from the photo-directional coupler 106 and the reference light projected from the polarization plane rotation device 160; and a signal processing section 111 which detects the mixed light projected from the light mixing device 109, converts the detected light into an electrical signal and subjects the electrical signal to a predetermined operational processing to obtain a measurement waveform.

Optical fiber strain measuring apparatus

An atomic force microscope comprises a probe having a sharply-pointed tip end. The probe is supported on the free end portion of a cantilever and is close to the surface of a specimen. When an interatomic force is produced, the cantilever is deformed, and the probe is displaced. The displacement of the probe is detected by an optical system. A light beam emitted from a light source is collimated by a lens, and reflected by a polarized beam-splitter, and also by a half-mirror. Then, the light beam passes through a quarter wavelength plate and an objective lens, such that the light is converged on the cantilever. The reflected light beam from the cantilever returns along the same optical path and passes through the splitter. The light beam is divided into two light beams at the splitter. These two light beams are reflected by respective prisms and are then incident on respective photodetectors. These photodetectors detect the displacement of the probe.

Atomic force microscope

Ultrasonic microscope

Growing community of inventors

Tokyo, Japan

Yasushi Satoh