Canon Kabushiki Kaisha

Yasushi Iwakura

Tetsuya Itano

Noriyuki Shikina

Yoichi Wada

Tomoya Onishi

Shoji Kono

Hisashi Takado

Kentaro Tsukida

Kiyofumi Sakaguchi

Nobuhiko Sato

Takashi Moriyama

Takuro Yamazaki

Taro Kato

Masahiro Fushimi

Fujio Kawano

Kohei Nagayama

Takahiro Shirai

Kaoru Okamoto

Kei Ochiai

Junya Tamaki

Katsunori Oya

Shinya Igarashi

Mayu Ishikawa

An imaging arrangement comprising: a plurality of pixels arranged in a matrix; and a signal processing arrangement. A first and a second line of the matrix each comprise a light-receiving pixel and a reference pixel, the light-receiving pixels each receive incident light and output a light signal based on the incident light, and each reference pixel outputs a pixel signal for forming an address signal. The processing arrangement provides a first address signal and a second address signal, wherein: the first address signal indicates the position of the first line and comprises a signal value based on the pixel signal from the first line; and the second address signal indicates the position of the second line and comprises a signal value based on the pixel signal from the second line; and the signal value of the first address signal is different to the signal value of the second address signal.

Imaging apparatuses, systems, and moving imaging objects

A solid-state imaging device includes a pixel that outputs a pixel signal of an analog signal, a readout unit that converts the pixel signal into a digital signal to generate a digital pixel signal, a memory unit that stores the digital pixel signal, and a first inspection signal output unit that outputs a first inspection signal to the memory unit such that the memory unit stores the first inspection signal. The first inspection signal stored in the memory unit is output from the memory unit in a period after output of the digital pixel signal of a frame ends and before output of the digital pixel signal of a next frame starts.

Solid-state imaging device, imaging system, and movable object

A photoelectric conversion apparatus, comprising: a photoelectric conversion unit; a charge accumulation unit configured to accumulate charges generated in the photoelectric conversion unit; and a transfer transistor configured to connect the photoelectric conversion unit and the charge accumulation unit to each other and to perform a transfer operation of a charge from the photoelectric conversion unit to the charge accumulation unit, wherein the photoelectric conversion apparatus outputs: a first signal obtained by performing an on-off operation of the transfer transistor a plurality of times in a state where the charge accumulation unit is accumulating charges; and a second signal obtained by performing an on-off operation of the transfer transistor a plurality of times in a state where the charge accumulation unit is not accumulating charges.

Photoelectric conversion apparatus and image pickup system

A solid-state imaging device includes a first detection pixel and a second detection pixel, each of the first detection pixel and the second detection pixel including a transfer transistor and an amplifier transistor connected to the transfer transistor via a first node, a voltage supply unit that supplies a predetermined voltage, and a connection switch connected between the voltage supply unit and a second node at which the transfer transistor of the first detection pixel and the transfer transistor of the second detection pixel are connected.

Solid-state imaging device, method of driving solid-state imaging device, and imaging system that can detect a failure while performing capturing

An image processing apparatus including a first acquisition unit for acquiring a visible-light image signal representing a visible-ray image which comes into focus at a first distance and an infrared image signal representing an infrared-ray image which comes into focus at a second distance that is shorter than the first distance and an infrared-ray image which comes into focus at a third distance that is longer than the first distance; a second acquisition unit for acquiring first brightness information, hue information, and saturation information from the visible-light image signal and at least second brightness information from the infrared image signal; a third acquisition unit for acquiring third brightness information based on edge information obtained from the first brightness information and edge information obtained from the second brightness information; and a generation unit for generating a second visible-light image using the third brightness information, the hue information, and the saturation information.

Image processing apparatus, imaging apparatus, and image processing method

At least one image pickup system that acquires distance information and prevents missing, or loss of, information while taking countermeasures against flicker, includes a first image pickup apparatus, a second image pickup apparatus, and a signal processing unit configured to process signals acquired from the first image pickup apparatus and the second image pickup apparatus. An exposure period of the first image pickup apparatus and an exposure period of the second image pickup apparatus are repeated a plurality of times in one frame. The exposure period of the first image pickup apparatus is overlapped with a non-exposure period of the second image pickup apparatus, and a non-exposure period of the first image pickup apparatus is overlapped with the exposure period of the second image pickup apparatus.

Image pickup system with overlap and non-overlap exposure period

An imaging device comprising a plurality of pixels and a processing unit. The plurality of pixels includes (i) a light-receiving pixel arranged to receive incident light and output a light signal based on the incident light, and (ii) a reference pixel arranged to output a pixel signal for configuring a failure detection signal. The processing unit is arranged to determine whether or not the failure detection signal is correct based on abnormality information indicating the abnormality of the reference pixel.

Imaging device, imaging system, moving body, and control method

Solid-state imaging device, method of driving solid-state imaging device, and imaging system having detection pixels and image acquisition pixels

An image capturing apparatus includes a plurality of pixels arranged on a substrate, a temperature signal output unit arranged on the substrate and configured to output a temperature signal representing a temperature, and a reference signal output unit arranged on the substrate and configured to output a reference signal used to correct the temperature signal. The temperature signal output unit and the reference signal output unit are arranged in regions different from each other on the substrate.

Image capturing apparatus, image capturing system, and movable apparatus

An imaging device has: a pixel unit including a first pixel and second pixels arranged around the first pixel and adapted to provide more brightness information than is provided by the first pixel; a directional property determination unit that determines a direction of an intensity distribution based on differences of the values of the second pixels; a correlation value calculation unit that calculates a correlation value of the values of the second pixels; and an interpolation processing unit that, when the correlation value is greater than a threshold based on a noise signal intensity in the values of the second pixels, interpolates a value of the first pixel that is based on the direction of the intensity distribution from the values of the second pixels and, otherwise, interpolates the value of the first pixel from the values of the second pixels without depending on the direction of the intensity distribution.

Imaging device, imaging system, and image processing method

A convex lens has surfaces including a flat surface and a projecting surface, and an anti-reflection structure configured to cover the projecting surface are included. The anti-reflection structure includes a first anti-reflection structure on the first end side, which is one of two end points of the line segment located nearer to the orthogonal projection of the apex than to the center point thereof, and a second anti-reflection structure on a second end side, which is one of the two end points of the line segment located nearer to the center point than to the orthogonal projection of the apex. A light transmittance of the second anti-reflection structure is greater than a light transmittance of the first anti-reflection structure.

Optical element, optical element array, and solid-state image-pickup apparatus

A dimming method of an organic EL displaying apparatus having a displaying unit constructed by combining pixels each having a substrate, an organic EL element formed over the substrate, a power supply line for supplying a power source to the organic EL element, and at least one TFT provided on a wiring path from the power supply line to the organic EL element. The TFT has a semiconductor layer which is arranged between a source electrode and a drain electrode and is electrically connected to the source electrode and the drain electrode. A laser beam is irradiated from a downward direction of the substrate to a region which does not overlap a gate electrode, the source electrode, the drain electrode, and the wiring layer when seen as a plan view in a plane region where the semiconductor layer is provided.

Dimming method of organic EL displaying apparatus and organic EL displaying apparatus

There is provided a display apparatus that can improve the protective function and light utilization efficiency of organic EL devices and that has a simple structure. The display apparatus includes a plurality of organic EL devices formed on a substrate and a protective layer formed on the organic EL devices. The protective layer includes a first protective layer made of an inorganic material, a second protective layer made of a resin and having a microlens formed therein, and a third protective layer made of an inorganic material.

Growing community of inventors

Kawaguchi, Japan

Yasushi Iwakura