Olympus Corporation

Olympus Optical Company, Ltd.

Polymer Processing Research Institute Ltd.

Renesas Electronics Corporation

The University of Tokyo

Sekisui Kagaku Kogyo Kabushiki Kaisha

National Research Institute for Metals

Kabushiki Kaisha Toshiba

Kyushu University

Nippon Petrochemicals Company, Limited

Jxtg Nippon Oil & Energy Corporation

Olympus Optcial Co., Ltd.

Yasuo Sasaki

Koichi Karaki

Mitsugu Sakai

Toshihiro Nakao

Haruhisa Tani

Eiji Yamamoto

Yasuhiro Omura

Kazutoshi Shiratori

Hiromichi Sakano

Setsuya Tsuyama

Heiji Ogino

Kazuhiko Kurihara

Hiromasa Fujita

Hiroshi Yazawa

Kiyoshi Matsumoto

Tomoki Funakubo

Isao Shimoyama

Masahide Yazawa

Masaki Matsumoto

Muneyuki Amano

Yuuki Kuroiwa

Yoshiharu Ajiki

Kiyoshi Tosaka

Shuichi Murakami

Kimihiko Nishioka

Chihaya Adachi

Masahiro Aoki

Takuya Tsukagoshi

Yusuke Takei

Koji Kimura

Ken Sato

Tomoaki Sato

Yuki Kuroiwa

Kenji Mitsumoto

Kouichi Karaki

Bakusui Daidoji

Kenichi Yamazaki

Takashi Onodera

Kentaro Noda

Tetsuo Kan

Takashi Kawashima

Masayuki Yahiro

Hiroko Sasaki

Shigezou Kojima

Hideo Kumehara

Akiko Hamada

Yasushi Kasao

Tetsuro Kan

An illuminating device includes an illumination light generator configured to generate illumination pulses of coherent light, and a speckle modulator configured to modulate speckle caused by the coherent light. The illumination pulse generator repeatedly generates a single illumination pulse group including a plurality of illumination pulses as a repetitive illumination pulse group.

Illuminating device, imaging system, endoscope system including the imaging system, and microscope system including the imaging system

A semiconductor device capable of executing a plurality of tasks in real time and improving performances is provided. The semiconductor device comprises a plurality of processors and a plurality of DMA controllers as master, a plurality of memory ways as slave, and a real-time schedule unit for controlling the plurality of masters such that the plurality of tasks are executed in real time. The real-time schedule unit RTSD uses the memory access monitor circuit and the data determination register to determine whether or not the input data of the task has been determined, and causes the task determined to have the input data determined to have been determined to be executed preferentially.

Semiconductor device

A semiconductor device capable of suppressing performance degradation and systems using the same are provided. The semiconductor device includes a plurality of processors CPUand CPU, a scheduling device(ID) connected to the processors CPUand CPUfor controlling the processors CPUand CPUto execute a plurality of tasks in real time, memoriesandaccessed by the processors CPUand CPUto store data by executing the tasks, and access monitor circuitsfor monitoring accesses to the memories by the processors CPUand CPU. When an access to the memory is detected by the access monitor circuit, the data stored in the memoryis transferred based on the destination information of the data stored in the memory

Semiconductor device and systems using the same

A bend information computation apparatus is to compute bend information representing a direction and a magnitude of bend of a target group including targets disposed at an identical position along a light guide. Each target modulates the intensity of guided light in accordance with the direction and magnitude of bend. The apparatus includes an input unit to be input detected light quantity information corresponding to each target, a storage to store a bend coefficient and intensity modulation information of each target, and a light quantity information relationship between the bend coefficient and intensity modulation information and the detected light quantity information, a first arithmetic operator to calculate light quantity variation information of each target, based on the detected light quantity information and light quantity information relationship, and a second arithmetic operator to calculate the bend information of the target group, based on the light quantity variation information and bend coefficient.

Bend information computation apparatus, endoscope system including bend information computation apparatus, bend information computation method, and program for bend information computation

A curvature sensor includes a light source, a flexible light guide including cores, and FBG sensors that are provided in the cores and constitute FBG sensor groups at predetermined positions at predetermined positions along longitudinal axes of the cores. The curvature sensor includes a detector that detects an optical spectrum of light from the FBG sensors, and a processor that obtains a bend of the light guide. FBG sensors provided in a core include a first FBG sensor and a second FBG sensor next to it. The first and second FBG sensors include gratings having first and second pitches. The first pitch is shorter than the second pitch and is closer to the second pitch than other pitches of gratings of all FBG sensors that are provided in the core and include gratings having pitches shorter than the second pitch.

Curvature sensor

A curvature sensor includes a light source, a flexible light guide including cores, FBG sensors that are provided in the cores and constitute FBG sensor groups at predetermined positions along longitudinal axes of the cores. The curvature sensor includes a detector that detects an optical spectrum of light from the FBG sensors, and a processor that determines a bend position and a bend amount of the light guide. The FBG sensor groups include a first FBG sensor group and a second FBG sensor group next to it. FBG sensors in the first and second FBG sensor groups include gratings having first and second pitches. The first pitch is shorter than the second pitch and is closer to the second pitch than other pitches of gratings of FBG sensors that include gratings having pitches shorter than the second pitch.

A bending detecting system includes a light guide, a first grating and a light detector. The light guide has elongated shape and is configured to guide an incident light in a propagating direction. The light guide includes a core and a cladding disposed around the core. The first grating is disposed in a boundary area, the boundary area including an outer surface of the core, and an adjacent area that is adjacent to the outer surface. The first grating includes a first periodic structure along the propagating direction with a first pitch, and is configured to generate a first diffracted light from the incident light. The light detector is configured to detect the first diffracted light from the first grating, and detect a bending of the light guide based upon an optical feature amount of the first diffracted light.

Bending detecting system, light guide body, tubular apparatus, light detecting apparatus, light detecting method, and optical bending measuring apparatus

A mesh nonwoven fabric which is seamless and excellent in appearance is provided. A seamless mesh nonwoven fabric is prepared by laminating a first mesh filmcontaining stem fibersstretching parallel to each other in a first direction and branch fibersconnecting adjacent stem fiberstogether, and a second mesh filmcontaining stem fibersstretching parallel to each other in a second direction intersecting the first direction and branch fibersconnecting adjacent stem fibers

Mesh nonwoven fabric

Provided is a photodetector including: an organic semiconductor () having protrusions; a metal layer () added onto the organic semiconductor (), for promoting at least one of localized plasmon resonance and surface plasmon resonance in which electrons are excited through irradiation of detection light; and a semiconductor () forming a junction with the metal layer (), for allowing electrons excited through the plasmon resonance to pass through the junction () with the metal layer ().

Photodetector

According to one embodiment, a thermal recycling plant system includes a cooler cools coolant recycling thermal from coolant circulating in a load apparatus and which consumes energy while operating and a controller controls the cooler. The controller includes a calculator and a monitor. The calculator calculates an optimal temperature optimal for the coolant by optimization calculation for minimizing energy consumption under given conditions. The monitor monitors an operating state of the load apparatus to determine whether an abnormality exists in the load apparatus. The monitor controls the cooler to cool the coolant to a temperature lower than the optimal temperature calculated, on determining that an abnormality exists in the load apparatus.

Thermal recycling plant system, apparatus for controlling a thermal recycling plant and method of controlling a thermal recycling plant

Provided is a scanning near-field optical microscope capable of obtaining, in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscopeaccording to the present invention includes: a light irradiating partfor emitting illumination light toward a samplea light receiving partfor receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating partand an incident side of the light receiving partand an ultrahigh-wavenumber transmitting mediumfor transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

Near-field optical microscope, near-field optical probe, and sample observation method

A test circuit connected between a test target circuit and a plurality of external terminals includes N first holding circuits to hold respectively N unit patterns produced by dividing an internal signal pattern to be input to or output from the test target circuit by N, where N is a natural number of two or greater, and a control circuit to make the internal signal pattern held in the N first holding circuits be changed selectively on a unit pattern basis based on a value of an identification signal assigned to each of the unit patterns beforehand, or to make the internal signal pattern held in the N first holding circuits be output selectively on a unit pattern basis based on the values of the identification signal.

Test circuit, pattern generating apparatus, and pattern generating method

In a vibration wave linear motor, a coupled driving contacting parts are respectively provided on the top and the bottom of a vibrator unit, and 2 upper and lower guide shafts which contact concave parts of the coupled driving contacting parts are supported by erecting parts of a supporting part. The lower guide shaft is pressed upward by spiral springs, so that the two guide shafts press and sandwich the vibrator. Alternating current voltages having different phases are applied to the vibrator unit, whereby the vibrator unit generates a vibration wave to generate elliptical rotation vibrations in the driving contacting parts. As a result, the vibrator, and the two guide shafts and the supporting part make a relative move in the shaft direction. Either the guide shafts or the vibrator is fixed, and the other is linked to an object to be driven.

Vibration wave linear motor

An ultrasonic oscillator, comprises a group of internal electrodes divided into four approximately equal parts along two directions, i.e., a second direction which is perpendicular to a direction of layers as first direction, and a third direction which is also perpendicular to the first direction; and comprises an electrode connection-use conductor film which is formed along a face perpendicular to the aforementioned direction of layers for electrically connecting a predetermined external electrode among the first group of external electrodes and a predetermined external electrode among the second group of external electrodes, respectively.

Ultrasonic oscillator

Growing community of inventors

Tokyo, Japan

Yasuo Sasaki