The University of Tokyo

Ihi Corporation

Sony Corporation

Daiichi Pure Chemicals Co., Ltd.

Yasuo Sakai

Hiroyuki Nose

Namio Kaneko

Mitsuru Uesaka

Daisuke Ishida

Katsuhiro Dobashi

Fumito Sakamoto

Masashi Yamamoto

Miyoshi Hirata

There is provided an image processing apparatus including an operation display unit for displaying an image on a display screen and capable of an operation input on the image displayed on the display screen, an operation input detection unit for detecting an operation input in the operation display unit, an approximate straight line derivation unit for deriving first approximate straight line approximately indicating a trajectory of the operation input based on the detection result in the operation input detection unit, and an image correction unit for correcting a tilt of the image displayed on the display screen based on the derived first approximate straight line and a predetermined reference line.

Image processing apparatus, image processing method, and imaging apparatus that corrects tilt of an image based on an operation input

An information processing apparatus includes: a storage unit which stores person relationship information representing relationships between people as a subject in a storage medium; an acquisition unit which acquires image data generated by imaging people as a subject; a detection unit which detects each person in an image; a specification unit which specifies each person detected from the image by the detection unit; and a determination unit which determines the relationship between multiple people detected from the image. When at least one person from among the people detected from the image is specified and another person is unable to be specified, the specification unit may specify the at least one other person on the basis of the relationship between the multiple people and the person relationship information.

Methods and apparatus for acquiring and analyzing image data

An X-ray waveform is generated by validating detection data corresponding to when an X-ray () is generated at a collision point () among X-ray detection data and invalidating other data. For example, when laser light () is pulse laser light and an electron beam () is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light () and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point ().

X-ray metering apparatus, and X-ray metering method

A charged particle beam decelerating device includes a high-frequency cavityprovided on an orbit of a charged particle beam, and a phase synchronizing devicefor synchronizing the charged particle beamin the high-frequency cavity with a phase of a high-frequency electric field. By moving the high-frequency cavityor changing an orbit length of the charged particle beam, the charged particle beam in the high-frequency cavity is synchronized with a phase of the high-frequency electric field

Charged particle beam decelerating device and method, and X-ray generating apparatus using the same

A high brightness X-ray generator and a high brightness X-ray generating method are provided which are able to promote an increase in X-ray brightness (i.e., an increase in an X-ray output) while suppressing an excessive increase in the cost of optical elements such as a laser unit, a mirror, and a lens. A high brightness X-ray generator generates an X-ray by inverse Compton scattering by colliding an electron beam with pulse laser light. There are provided a plurality of pulse laser units (A,B) which emits a plurality of pulse laser lights (a,b ) in predetermined periods, an optical-path matching unit () which matches optical paths of the plurality of pulse laser lights, and a timing control unit () which controls timings of the optical-path matching unit and the pulse laser units, wherein the plurality of pulse laser lights is emitted from the same optical path at different timings.

High brightness X-ray generating device and method

An electron beam detection device () is arranged on an electron beam passing path so that a beam delay time tfrom a passing moment of an electron beam () to a moment when the beam reaches a predicted collision point () is longer than a laser delay time tfrom a moment when a command for generating laser light () is issued to the moment when the laser light reaches the predicted collision point () by at least a predetermined delay time &#x394;t. The device () may detect passing therethrough without affecting the electron beam and output a laser light generation command from a laser light command delay circuit () when the predetermined delay time &#x394;t (=t&#x2212;t) has elapsed after the detection.

Device and method for adjusting collision timing between electron beam and laser light

In an immunoassay, ultrafine particles having an average particle size of 0.2 .mu.m or smaller and sensitized with a substance, which has reactivity with the materials to induce a nonspecific immunoreaction, are added to a sample to inhibit the nonspecific immunoreaction. The above immunoassay can avoid the influence of nonspecific factors more effectively, thereby permitting accurate measuremens on the concentrations of antigens in samples such as blood, urine, body fluid and the like.

Growing community of inventors

Tokyo, Japan

Yasuo Sakai