Other

Yasunori Idehara

Shunsuke Nagasawa

Hiroyuki Yamagata

An image defect detection apparatus includes: an image acquisition section for acquiring an image as image data; a check section for checking for the presence or absence of a defect in the image, the defect being of one of a plurality of different types. The check section includes: a matrix setting subsection for setting, within the acquired image, an inspection reference region and an inspection region in accordance with each type of defect; a comparison value extraction subsection for extracting a comparison value based on image data in the inspection reference region and image data in the inspection region as set by the matrix setting subsection; and a comparison subsection for determining the presence or absence of the defect based on a comparison between the comparison value extracted by the comparison value extraction subsection and a predetermined threshold value.

Growing community of inventors

Okayama, Japan

Yasunori Idehara