Topcon Corporation

Kabushiki Kaisha Topcon

Yasuko Tsuruga

Nobuo Kochi

Takahiro Watanabe

Mitsuo Ishii

Hiroyuki Okada

Akihiro Harada

Shinichi Okada

Hirotami Koike

Toshihiro Iwai

Jun Onose

Tatsuo Yamaguchi

Hiroyuki Aoki

Toshifumi Mihashi

Yoko Hirohara

The object of the invention is to provide a favorable spectral characteristic that reduces variation depending on the frequency of received light intensity, and that is gentle on a subject eye. It also eliminates displacement between positions of respective spectral images of the same part even if a change in alignment occurs between the eye and apparatus with the lapse of time. An apparatusfor measuring spectral fundus image data of this invention comprises: an illumination optical systemhaving an illumination light sourcethat emits a light beam in a specified wavelength range; a light receiving optical systemfor forming a fundus image on the light receiving surface of a photographing section; a liquid crystal wavelength tunable filtercapable of choosing a wavelength of a transmitted light beam in a specified wavelength range; a spectral characteristic correction filterhaving wavelength characteristic for correcting the wavelength characteristic of the emitted light intensity of the illumination light sourceand the transmission wavelength characteristic of the wavelength tunable filterso that the received light intensity on the light receiving surface is kept within the specified range; and a data measuring sectionfor taking the spectral fundus image data from the light receiving surface while changing the wavelength of the light beam passing through the wavelength tunable filter

Apparatus and method for measuring spectrum image data of eyeground

A three-dimensional coordinate measuring apparatus has a first and second incident angle adjusting sections for adjusting the attitude of the object in the directions of first and second neutral axes, respectively, to adjust the incident angle of the beam projected on the object from an imaging optical system relative to the object so that first and second stereoscopic images of the object can be formed, a matching process section for searching for corresponding points corresponding to measurement points in first and second search directions generally perpendicular to the first and second neutral axes, respectively, in the first and second stereoscopic images, and a shape measuring section for obtaining three-dimensional coordinate data of the object based on the relation between the measurement points and the corresponding points in the first and second stereoscopic images.

Apparatus and method for three-dimensional coordinate measurement

To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample. The electron beam system has a correction factor storing sectionfor storing a correction factor at a reference tilt angle with respect to a plane which is used to tilt a sample by a sample tilting section, an approximate coordinate measuring sectionfor obtaining an approximate shape or approximate coordinate values of the sample based on an output corresponding to a stereo image from an electron beam detecting section, an image correcting sectionfor correcting the stereo image according to the tilt angle created by the sample tilting sectionbased on the shape or coordinate values of the sample obtained in the approximate coordinate measuring sectionusing a correction factor stored in the correction factor storing section, and a precise coordinate measuring sectionfor obtaining a shape or coordinate values of the sample which are more precise than those obtained in the approximate coordinate measuring sectionbased on a corrected stereo image obtained in the image correcting section

Electron beam system and electron beam measuring and observing methods

A lens layout setting apparatus for lens grinding processing apparatus having a display screen of a display device for various settings for processing data of eyeglass lens shape for an eyeglass frame, and data of lens grinding process to grind the lens based on the data of lens shape for the frame, further including a control means to add, delete or rearrange a setting condition. The display device displays data of eyeglass lens shape for an eyeglass frame, and of eyeglass lens grinding process required for grinding the lens based on the data, and further displays tabs arranged to display a layout operating screen to set a layout of the data of lens shape for the frame, a state of measuring an edge thickness of the lens, simulation of the shape of a V-shaped protrusion formed on an edge of the lens, and a grinding process screen.

Lens layout setting apparatus for lens grinding process and display apparatus for the same

A lens layout display apparatus for lens grinding processing apparatus having a display screen on which is displayed data of eyeglass lens shape for an eyeglass frame, and data of eyeglass lens grinding process to grind the eyeglass lens based on the data of eyeglass lens shape for an eyeglass frame, the display means also displaying various icons which show a state of measuring an edge thickness of the eyeglass lens, a state of simulation of the shape of a V-shaped protrusion formed on an edge of the eyeglass lens, a state processing the edge portion of the eyeglass lens, and a completion of the grinding process of an eyeglass lens.

Growing community of inventors

Tokyo, Japan

Yasuko Tsuruga