Sharp Kabushiki Kaisha Corporation

Yasuki Fukui

Yoshiki Sota

Atsuya Narai

Yuji Matsune

Kazuhito Nagura

Kazuo Tamaki

Yuji Yano

Hiroyuki Juso

Koji Miyata

Yasuhisa Yamaji

Seiji Ishihara

Naruki Hara

Masataka Yamashita

A first base plate includes a plurality of first positioning hole portions, an accommodation portion that accommodates an optical module, a first opening portion, a first pressing portion, and a first engagement portion. A second base plate has a second positioning hole portion that is disposed at a position corresponding to the first positioning hole portion, a second opening portion that is disposed at a predetermined positional relationship with respect to the second positioning hole portion, a second holding portion, a conduction portion, a second pressing portion, a substrate portion, a cover portion, a second hinge portion, and a second engagement portion.

Test socket and method of manufacturing the same

A semiconductor device of the present invention includes: a circuit substrate; an optical semiconductor element provided on the circuit substrate; and a sealing resin provided on the circuit substrate, with which the optical semiconductor element is sealed, the sealing resin having a cuboid shape or a cubic shape, the sealing resin having an outer shape having at least one cutout part, in a case where a single cutout part is formed, the cutout part being provided in an area other than a center area of a top surface of the sealing resin, in a case where a plurality of cutout parts are provided, the cutout parts are formed so as not to be symmetric with respect to the central point on the top surface. With this arrangement, it is possible to provide a semiconductor device which can secure prevention of a sealing resin from being, in an erroneous direction, fitted into a connector.

Semiconductor device and connector

In a semiconductor device in which a second semiconductor chip is layered on a first semiconductor chip mounted on a substrate, a mounting-use bonding layer being formed on a reverse surface of the second semiconductor chip with respect to a circuit formation thereof, the mounting-use bonding layer functions as a bonding agent and as a supporting member for supporting protruded part of the second semiconductor chip, which is protruded from an outer edge of the first semiconductor chip. In this semiconductor device, it is possible to bond the second semiconductor chip and the substrate stably by wire bonding.

Semiconductor device and manufacturing method of same

A first semiconductor chip is produced by affixing a thermo-compression sheet to the back surface of a wafer having a circuit formed on its front surface. The first semiconductor chip is mounted on a circuit board including an insulating substrate and a wiring layer provided on the insulating substrate so that the back surface of the first semiconductor chip faces the circuit board. A second semiconductor chip produced in the same manner as the first semiconductor chip is mounted on the first semiconductor chip with its back surface facing the first semiconductor chip. Each of the first and second semiconductor chips is wire-bonded to the wiring layer with a wire. The first and second semiconductor chips and the wire are sealed with a sealing resin. The wiring layer is connected to external connection terminals through via holes provided in the insulating substrate.

Semiconductor device and method of manufacturing the same

A wiring substrate of the present invention includes a terminal section, provided on a first surface of an insulating substrate, for wire or flip-chip bondings; a land section, provided on the insulating substrate, for an external connection terminal; wiring patterns, respectively provided on the first surface and a second surface on the other side of the first surface, for making electrical connection between the terminal section and the land section; and a support pattern, provided on the second surface corresponding in position to the terminal section, for improving bondings. The wiring substrate can relieve connection failure in bondings.

Wiring substrate, semiconductor device and package stack semiconductor device

A semiconductor device includes a first semiconductor chip and a second semiconductor chip which are laminated on a substrate, wherein electrode terminals which are provided on each of the semiconductor chips are electrically connected to the substrate by first bonding wires and second bonding wires, and an insulation layer is formed between the second bonding wires and the first semiconductor chip.

Semiconductor device having insulation layer and adhesion layer between chip lamination

A semiconductor device includes a wiring substrate having wiring and a solder resist for protecting the wiring, which are provided on an insulating substrate, a semiconductor chip which is mounted via the wiring protective film on the wiring substrate on a surface on the other side of the surface on which a circuit is provided to face a side of the wiring substrate on which the wiring is formed, and a wire for electrically connecting the circuit provided on the surface of the semiconductor chip and the wiring of the wiring substrate, and the surface of the solder resist and the semiconductor chip are firmly adhered to each other. In this semiconductor device, because the solder resist and the semiconductor chip are firmly adhered to each other, there arise no bubbles due to a spacing at a portion where the solder resist and the semiconductor chip are bonded with each other. As a result, a crack generated when heating the semiconductor device when installing it in electrical devices can be prevented, and the percent defective can be significantly reduced in a reliability test after bonding is made.

Growing community of inventors

Sakai, Japan

Yasuki Fukui