Kabushiki Kaisha Toshiba

Yasuhisa Takeyama

Osamu Hirabayashi

Yoshihisa Iwata

Junichi Miyamoto

Hironori Banba

Takahiko Sasaki

Nobuaki Otsuka

Hideko Oodaira

Yuki Fujimura

A memory cell of a static random access memory (SRAM) includes a pair of drive transistors, a pair of load transistors, a pair of write-only transfer transistors, a pair of read-only transfer transistors, a pair of read-only drive transistors, and a pair of column selection transistors. The memory cell also includes a word line, a pair of write bit lines, a pair of read bit lines, and a column selection line.

Semiconductor storage device

The semiconductor memory device includes: an inverter pair of a cross-coupled first and second inverters; a first transfer transistor including a front gate and a back gate connected to a first node to which an output terminal of the first inverter and an input terminal of the second inverter are connected; a second transfer transistor including a front gate and a back gate connected to a second node to which an output terminal of the second inverter and an input terminal of the first inverter are connected; a driver transistor whose gate is connected to the second node; and a read transistor including a front gate, a back gate connected to the second node, and a current path whose one end is connected to one end of a current path of the driver transistor.

Semiconductor memory device

Disclosed is an SRAM including a latch circuit, first and second write transfer gates, first and second write buffer transistors, read driver transistor, and read transfer gate. A write path is formed by connecting first and second write transfer gates and first and second write buffer transistors to the latch circuit which stores data and the path is controlled by use of a word line and data write bit lines. Further, a read path is formed by connecting a read driver transistor and read transfer gate to the latch circuit and the path is controlled by use of the word line, read bit line and data of the latch circuit.

Memory cell structure of SRAM

A semiconductor device having hierarchized bit lines including an upper-layer bit line and a lower-layer bit line, includes at least one memory cell array to which the lower-layer bit line is connected and a selection transfer gate having an NMOS switching transistor and a PMOS switching transistor to connect the lower-layer bit line to the upper-layer bit line. The NMOS switching transistor and the PMOS switching transistor of the selection transfer gate are arranged opposite to each other in a column direction to sandwich the memory cell array.

Semiconductor device having hierarchized bit lines

A semiconductor circuit device includes an oscillator for outputting an oscillating signal, a driving signal generator for generating driving signals having respective phases based on a counting of oscillations of the oscillating signal, and a charge pump circuit driven by the driving signals. A pulse width ratio of the driving signals to one another is constant even when an oscillation period of the oscillating signal output by the oscillator changes, whereby the charge pump operates properly under changing conditions.

Growing community of inventors

Yokohama, Japan

Yasuhisa Takeyama