Mitutoyo Corporation

Machine Vision Lighting Inc.

Yasuhiro Takahama

Masaoki Yamagata

Kentaro Nemoto

Hiraku Ishiyama

Masaki Kurihara

Hiroshi Sakai

Tomoyuki Miyazaki

Masanori Arai

Jyota Miyakura

Yutaka Watanabe

Shigeki Masumura

Yuji Kudo

Harumasa Ito

An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.

Shape reconstruction method and image measurement device

An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.

Inner-wall measuring instrument and offset-amount calculation method

The present invention includes a preparatory step of providing a calibration work piece having a flat reflecting surface as a work piece, and arranging the reflecting surface to be parallel to a standard optical axis and orthogonal or parallel to pixel array directions of an image capture element; a rotation step of rotating a prism centered on the standard optical axis; a brightness detection step of detecting the brightness of an image captured by the image capture element at each of a plurality of rotation positions of the prism; and a positioning step of aligning the prism at a rotation position where the brightness detected by the brightness detection step is greatest.

Calibration method of image measuring device

According to an embodiment of the present invention, a method of measuring a surface of an object having a curved shape by measuring a distance from a measurement head to the object, includes: setting a measuring region of the object and a threshold value of concave and convex; acquiring shape reference data including the curved shape of the object; acquiring three-dimensional data of the surface of the object by measuring the distance between the object in the measuring region and the measurement head; acquiring curve removed data by removing the shape reference data from the three-dimensional data; calculating second reference data by calculating first reference data based on the curve removed data, by removing data exceeding the threshold value with respect to the first reference data, from the curve removed data, and by averaging the curve removed data; and calculating shape data of the concave and convex.

Measurement method and measurement program for calculating roughness of a curved surface

A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.

Double cone stylus, touch probe, and method of calibrating double cone stylus

A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.

Calibrating jig, profile measuring device, and method of offset calculation

A form measuring mechanism () which measures form of an object () by bringing a probe () into direct contact with the object includes a plurality of reference spheres () for calibrating the probe, a judging system/controller () for judging form abnormal values common in position and size to each other and form abnormal values not common to each other obtained by measuring the reference spheres, and a notifying display unit () for notifying at least any one of a contamination or dust adhering state of the probe judged from the common form abnormal values and a worn state and contamination or dust adhering states of the reference spheres judged from the form abnormal values not common to each other. Accordingly, it becomes possible to identify contamination or dust adhesion of the probe or contamination or deformation due to wearing of a reference sphere, and at least in the case of contamination or dust adhesion of the probe or reference sphere, the location of the contamination or dust adhesion can be identified, and in the case of wearing of the probe or reference sphere, a situation of the worn region can be identified or necessity of replacement of the probe or reference sphere can be judged.

Growing community of inventors

Kawasaki, Japan

Yasuhiro Takahama