Nec Corporation

Yasuhiro Sogawa

Tomoya Sakai

Nobuhiro Mikami

A learning deviceincludes correspondence inference unit which calculates outputs of predictors, which have learned for seen tasks or seen classes, for test input data, and infers correspondences between the calculated outputs and attribute information corresponding to an unseen task or an unseen class, and prediction unit which calculates a prediction output for the attribute information corresponding to the unseen task or the unseen class, using the inferred correspondences.

Learning device and learning method

In order to supplement results of diagnosis of degradation of an object that has been implemented at set intervals using a degradation progression model for simulating the progression of degradation of the object, a degradation prediction apparatusis provided with: a data generation unitconfigured to generate, as supplement data, diagnosis results that would be obtained if the degradation diagnosis were performed at an interval shorter than the set interval; a prediction model generation unitconfigured, using the supplement data, to generate a prediction model for predicting a degradation index indicating a degradation state of the object at a specific point in time; and a degradation index prediction unitconfigured to predict the degradation index of the object based on the prediction model.

Growing community of inventors

Tokyo, Japan

Yasuhiro Sogawa