Hitachi, Ltd.

Tdk Corporation

Hitachi Solutions, Ltd.

Yasuhiro Ozawa

Yuji Takagi

Kenji Obara

Ryo Nakagaki

Kazunori Oshima

Ken Matsuura

Toshiei Kurosaki

Seiji Isogai

Nobuhiro Kakeno

Akihiro Ii

Hiroaki Nasu

Sana Imakubo

Yuuichi Terazaki

Provided is a manufacture and sales strategy planning method comprising a step of determining, based on information related to a sales plan of a plurality of products and a production capacity of a production facility to produce each product, whether there is any spare capacity in the production capacity of the production facility in relation to the sales plan for each of the products, a step of applying one among a plurality of profit improvement strategies, according to an availability of the spare capacity, to each product determined in this step, and calculating an improvement effect of each product, a step of selecting, based on each calculation result obtained in this step, a specific product among the plurality of products in which the improvement effect has exceeded a set value with regard to each of the plurality of profit improvement strategies, a step of extracting, for each profit improvement strategy, an item which satisfies a restricting condition of sale or production of the specific product selected in this step and which configures the specific product, and a step of planning a manufacture and sales strategy related to the items extracted in this step, and selecting one or more specific item strategies based on the improvement effect, wherein a supply and demand plan is simulated by reflecting the improvement effect of the selected strategy.

Manufacture and sales strategy planning method and device thereof

A wireless power receiving device includes a receiving coil that receives AC power through an AC magnetic field, a rectification circuit that converts the AC power received by the receiving coil into DC power and outputs the obtained DC power to a load, a filter circuit provided between the rectification circuit and the load, an input voltage detection circuit that detects the input voltage of the filter circuit, an output voltage detection circuit that detects the output voltage of the filter circuit, a target voltage generation circuit that generates a second target voltage that is a target value of the input voltage based on the output voltage and a first target voltage that is a target value of the output voltage, and a receiving-side transmitter that transmits difference information indicating the difference between the input voltage and the second target voltage to the wireless power transmitting device.

Wireless power receiving device and wireless power transmission system

A wireless power transmission system includes a power feeding device and a power receiving device, wherein the power feeding device includes: a power feeding coil which receives an electric power to generate an AC magnetic field; an inverter for supplying an alternating-current power under a predetermined driving frequency to the power feeding coil; a current detection circuit for detecting a peak value of an alternating current flowing in the power feeding coil; and a controller for controlling the alternating current flowing in the power feeding coil. The power receiving device includes: a power receiving coil for receiving electric power wirelessly via the AC magnetic field; a power receiving side resonance capacitor which configures a power receiving side LC resonance circuit together with the power receiving coil; and a rectifier for rectifying the electric power received by the power receiving coil.

Wireless power transmission system

According to the present invention, techniques including a method and apparatus for classifying and displaying images are provided. In an embodiment of the present invention a defect image classification method using inspected objects is provided. The method includes defect images obtained from at least one inspected object. Next a set of defect images is classified into a specified category, which has a feature. The defect images are arranged for display according to the feature and then displayed. The arranging of the defect images may also be based on an evaluation value for each defect image. Another embodiment provides a defect image classification method using inspected objects. Defect images are obtained from at least one inspected object. Next the defect images are classified into a plurality of categories and at least two information items for example, a defect distribution diagram showing locations of defects in the inspected object, information associated with a category of the plurality of categories, and a defect size distribution, are displayed.

Defect image classifying method and apparatus and a semiconductor device manufacturing process based on the method and apparatus

Growing community of inventors

Tokyo, Japan

Yasuhiro Ozawa