Omron Corporation

Kureha Kagaku Kogyo Kabushiki Kaisha

Yasuhiro Ohnishi

Yasumoto Mori

Shree Kumar Nayar

Takeshi Kojima

Daisuke Mitsumoto

Shinya Matsumoto

Masaki Suwa

Takashi Shimizu

Kennosuke Hayashi

Hiroki Katono

Takashi Sakai

Xingdou Fu

Lin Miao

Tuo Zhuang

Masatoshi Kimachi

To Sho

A control apparatus according to one or more embodiments generates poses of the measurement device to measure an object, determines, for the measurement device, a measurement path including the poses to cause the measurement device to move along the measurement path including the poses and to measure the object, instructs the robot to move the measurement device along a movement path including the measurement path and instructs the measurement device to measure the object in the poses, recognizes the object using obtained measurement data, and determines the measurement path for the measurement device for a next operating cycle.

Control apparatus for robotic system, control method for robotic system, computer-readable storage medium storing a computer control program, and robotic system

Provided is an inter-reflection detection apparatus including: an irradiation unit configured to emit light having variable-frequency sinusoidal patterns; an image acquisition unit configured to acquire an image of an object irradiated with the light from the irradiation unit; a phase determination unit configured to determine a phase at each position in the image; and a detection unit configured to detect a region in which inter-reflection occurs. The detection unit is configured to determine a phase difference between a phase acquired from an image generated by irradiation of a low-frequency sinusoidal pattern and a phase acquired from an image generated by irradiation of a high-frequency sinusoidal pattern for a plurality of combinations of low-frequency waves and high-frequency waves, and determine that inter-reflection occurs in a region in which the phase difference for any one of the plurality of combinations is equal or more than a threshold.

Inter-reflection detection apparatus and inter-reflection detection method

The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.

Three-dimensional measurement apparatus, three-dimensional measurement method and non-transitory computer readable medium

A three-dimensional measurement system capable of realizing high-speed processing while increasing measurement resolution are provided. The system includes: an image capture unit including a first and second image capture units that are spaced apart; a first calculation unit calculates a parallax at first feature points in the images using distance information of a three-dimensional measurement method other than a stereo camera method or information for calculating a distance, using at least one of the first and second image capture units; and a second calculation unit calculates a parallax at second feature points based on a corresponding point for the second feature point by using the stereo camera method using the first and second image capture units, and specifies a three-dimensional shape based on the parallax at the first and second feature points. The second calculation unit sets a search area based on the parallax at the first feature points.

Three-dimensional measurement system and three-dimensional measurement method

A control device assumes that observation light observed by an imaging device is composite light of primary reflection light and secondary reflection light. The control device acquires three or more samples of a brightness amplitude value of the observation light, calculates a phase error caused by the secondary reflection light using these samples, calculates a corrected phase value by correcting a phase value of the observation light using the phase error, and calculates a three-dimensional position of the measurement point on the measurement object based on the corrected phase value.

Three-dimensional shape measurement device, three-dimensional shape measurement method, and program

A control device acquires a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies, as observation signals for a measurement point on a measurement object. The control device repeatedly executes processing for estimating two component signals included in each observation signal, so as to separate the observation signal into two component signals, and calculate a three-dimensional position of the measurement point based on the phases of the separated component signals.

Three-dimensional-shape measurement device, three-dimensional-shape measurement method, and program

A measurement target is captured using two types of illumination patterns set such that only color features of specular objects change, the two images that are obtained are compared, and objects are identified as being specular objects or diffuse objects depending on whether the color features change markedly. At this time, the emission intensity distribution of each illumination pattern is devised such that specular lobe components that are included in reflected light are canceled out.

Image processing device, method for controlling same, program, and inspection system

An observing apparatus includes a lighting device for irradiating a surface of a measuring target with light having a first light source distribution, and an imaging section for imaging the surface of the measuring target. Considering a first plane passing through a measurement point, the first light source distribution is set such that: (1) a radiance L(&#x3b8;) changes in a continuous or stepwise manner according to an angle &#x3b8;, and (2) the radiance L(&#x3b8;) is not zero in a local region of a predetermined range of &#xb1;&#x3c3; having a point located at a predetermined angle &#x3b8;c as a center on the first plane when viewed from the measurement point, and the following equation substantially holds for arbitrary a satisfying 0&#x3c;a&#x2266;&#x3c3;; L(&#x3b8;&#x2212;a)+L(&#x3b8;+a)=2&#xd7;L(&#x3b8;).

Profilometer, measuring apparatus, and observing apparatus

A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.

Apparatus and method for inspecting surface state

The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.

Shape measurement apparatus and calibration method

A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape being obtained by the shape calculating device using information on the distance obtained by the ranging device.

Shape measuring apparatus and shape measuring method

Disclosed herein are a novel phosphate compound by which a copper ion can be dispersed in a high proportion in a synthetic resin, thereby providing excellent visible ray-transmitting property and performance that near infrared rays are absorbed with high efficiency, a preparation process thereof, a phosphate copper compound obtained from the phosphate compound and a preparation process thereof, and a near infrared ray-absorbing acrylic resin composition which has both excellent visible ray-transmitting property and near infrared rays absorption capability.

Phosphate compound and preparation process thereof, phosphate copper compound and preparation process thereof, near infrared ray absorber, and near infrared ray-absorbing acrylic resin composition

Growing community of inventors

Kyotanabe, Japan

Yasuhiro Ohnishi